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Nickel Mediated Transformation of Amorphous Carbon to Graphite

Published online by Cambridge University Press:  22 February 2011

Toshio Itoh  and
Robert Sinclair
Toshio Itoh
Affiliation:
Department of Materials Science and Engineering, Stanford University, Stanford, CA 94305
Robert Sinclair
Affiliation:
Department of Materials Science and Engineering, Stanford University, Stanford, CA 94305
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Abstract

Reactions between Ni and amorphous carbon (a-C) below 600°C have been investigated using differential scanning calorimetry (DSC) and in situ annealing in a transmission electron microscopy (TEM) of Ni/a-C layered films deposited by DC sputtering. DSC data show that there are two exothermic peaks in the temperature range around 200-600°C. One is a weak and broad peak below 500°C and the other is a strong and sharp peak at around 530°C. In situ heating in the TEM revealed that the low temperature peak corresponds to a series of reactions for nickel carbide (Ni3C) formation and decomposition into Ni and carbon, most likely in a glassy state. The higher temperature peak was found to correspond to graphitization of a-C by a solution-precipitation mechanism. Graphite formed in this process is strongly textured with the (0002) graphite basal planes parallel to the original Ni/a-C interface.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 349: Symposium T – Novel Forms of Carbon II , 1994 , 31
Copyright
Copyright © Materials Research Society 1994

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References

REFERENCES

1. Banerjee, B.C. et al. , Nature 192,450 (1961)Google Scholar
2. Strong, H.M., J. Chem. Phys. 39, 2057 (1963)Google Scholar
3. Tauster, S.J. et al. , J. Am. Chem. Soc. 100, 170 (1978)Google Scholar
4. Nguyen, T.D. et al. , in Thin Film Structure and Phase Stability, edited by Clemens, B.M. and Johnson, W.L. (Mater. Res. Soc. Proc. 187, Pittsburgh, PA, 1990) pp. 95 Google Scholar
5. Jiang, Z. et al. , J. Appl. Phys. 72, 931 (1992)Google Scholar
6. Marsh, H. and Warburton, A.P., J. Appl. Chem. 20, 133 (1970)Google Scholar
7. Irving, S.M. and Walker, P.L. Jr, Carbon 5, 399 (1967)Google Scholar
8. Derbyshire, F.J. et al. , Carbon 10, 114 (1972)Google Scholar
9. Derbyshire, F.J. et al. , Carbon 13, 111 (1975)Google Scholar
10. Holstein, W.L. et al. , in Chemistry and Physics of Carbon Volume 18, edited by Thrower, P.A. (Marcel Dekker, New York, 1982) pp. 139 Google Scholar
11. Lamber, R. et al. , Surface Science 197, 402 (1988)Google Scholar
12. Konno, T.J., Ph.D. Thesis (Stanford University, 1993)Google Scholar
13. Fitzer, E. and Kegel, B., Carbon 6, 433 (1968)Google Scholar
14. Nagakura, S., J. Phy. Soc. Japan 12, 482 (1957)Google Scholar
15. Konno, T.J. and Sinclair, R., Phil. Mag. B66, 749 (1992).Google Scholar
16. Konno, T.J. and Sinclair, R., Mater. Sci. Eng. A, in press (1994).Google Scholar
17. Sinclair, R. and Konno, T.J., in Phase Transformations in Thin Films, edited by Atzmon, M. et al. (Mat. Res. Soc. Proc. 311, Pittsburgh, PA, 1993) pp. 3 Google Scholar
18. Konno, T. J. and Sinclair, R., ibid., pp. 99 Google Scholar
19. Bravman, J. and Sinclair, R., J. Electron Microscopy Technique 1, 53 (1984)Google Scholar
20. Nishitani, S.R. et al. , J. Mater. Sci. Letters 4, 872 (1985)Google Scholar