Crossref Citations
This article has been cited by the following publications. This list is generated based on data provided by
Crossref.
Tanner, B. K.
1989.
High Resolution X-ray Diffraction for the Characterization of Semiconducting Materials.
Advances in X-ray Analysis,
Vol. 33,
Issue. ,
p.
1.
Tanner, B.K.
1990.
High resolution X-ray diffraction and topography for crystal characterization.
Journal of Crystal Growth,
Vol. 99,
Issue. 1-4,
p.
1315.
Loxley, Neil
Bowen, D. Keith
and
Tanner, Brian K.
1990.
Application of a Desk-Side Double-Axis X-Ray Diffractometer for Very Large Area Epilayer Characterization.
MRS Proceedings,
Vol. 208,
Issue. ,
Tanner, B. K.
1990.
Advances in X-Ray Analysis.
p.
1.
Tartaglia, J. M.
Crochiere, S. M.
Kalnas, C. E.
Farrington, D. L.
Kronwasser, J. A.
and
Pearah, P. J.
1991.
A study of etch pit density and x-ray rocking curves for GaAs substrate evaluation.
Journal of Electronic Materials,
Vol. 20,
Issue. 5,
p.
345.
Loxley, N
Cockerton, S
Cooke, L M
Gray, T
Tanner, B K
and
Bowen, D K
1993.
New Algorithms for Rapid Full-Wafer Mapping by High Resolution Double Axis X-Ray Diffraction.
MRS Proceedings,
Vol. 324,
Issue. ,
Tobin, S. P.
Krueger, E. E.
Pultz, G. N.
Kestigian, M.
Wong, K. K.
and
Norton, P. W.
1993.
X-ray diffraction characterization of LPE HgCdTe heterojunction photodiode material.
Journal of Electronic Materials,
Vol. 22,
Issue. 8,
p.
959.
Tobin, S. P.
Tower, J. P.
Norton, P. W.
Chandler-Horowitz, D.
Amirtharaj, P. M.
Lopes, V. C.
Duncan, W. M.
Syllaios, A. J.
Ard, C. K.
Giles, N. C.
Lee, Jaesun
Balasubramanian, R.
Bollong, A. B.
Steiner, T. W.
Thewalt, M. L. W.
Bowen, D. K.
and
Tanner, B. K.
1995.
A comparison of techniques for nondestructive composition measurements in CdZnTe substrates.
Journal of Electronic Materials,
Vol. 24,
Issue. 5,
p.
697.
Doucette, L. D.
da Cunha, M. Pereira
and
Lad, R. J.
2005.
Precise orientation of single crystals by a simple x-ray diffraction rocking curve method.
Review of Scientific Instruments,
Vol. 76,
Issue. 3,