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New Structure of CTAB Templated Silica Films as revealed by GISAXS coupled to HRTEM

Published online by Cambridge University Press:  01 February 2011

Sophie Besson
Affiliation:
Laboratoire CNRS/Saint-Gobain, 39 quai Lucien Lefranc, 93303 Aubervilliers, France LPMC, Ecole Polytechnique, 91128 Palaiseau, France
Catherine Jacquiod
Affiliation:
Laboratoire CNRS/Saint-Gobain, 39 quai Lucien Lefranc, 93303 Aubervilliers, France
Thierry Gacoin
Affiliation:
LPMC, Ecole Polytechnique, 91128 Palaiseau, France
André Naudon
Affiliation:
LMP, Université de Poitiers, 86960 Futuroscope and LURE, 91405 Orsay, France
Christian Ricolleau
Affiliation:
LMCP, Université Paris VII, 4 place Jussieu, 75252 Paris, France
Jean-Pierre Boilot
Affiliation:
LPMC, Ecole Polytechnique, 91128 Palaiseau, France
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Abstract

A microstructural study on surfactant templated silica films is performed by coupling traditional X-Ray Diffraction (XRD) and Transmission Electronic Microscopy (TEM) to Grazing Incidence Small Angle X-Ray Scattering (GISAXS). By this method it is shown that spin-coating of silicate solutions with cationic surfactant cetyltrimethylammonium bromide (CTAB) as a templating agent provides 3D hexagonal structure (space group P63/mmc) that is no longer compatible with the often described hexagonal arrangement of tubular micelles but rather with an hexagonal arrangement of spherical micelles. The extent of the hexagonal ordering and the texture can be optimized in films by varying the composition of the solution.

Type
Research Article
Copyright
Copyright © Materials Research Society 2000

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References

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