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Near-field photoluminescence spectroscopy of InGaN quantum dots

Published online by Cambridge University Press:  01 February 2011

Alexander Mintairov
Affiliation:
[email protected], University of Notre Dame, EE Department, University of Notre Dame, Notre Dame, IN, 46556, United States, 574 9333
J. Merz
Affiliation:
D. Sizov
Affiliation:
V. Sizov
Affiliation:
V. Lundin
Affiliation:
S. Usov
Affiliation:
E. Zavarin
Affiliation:
A. Tsatsul'nikov
Affiliation:
Yu. Musikhin
Affiliation:
A. Vlasov
Affiliation:
N. Ledentsov
Affiliation:
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Abstract

We used temperature dependent near-field magneto-photoluminescence spectroscopy to study emission properties of blue-green InGaN quantum dot (QD) structures with spatial resolution of ∼ 100 nm. The QD structures grown by MOCVD are 3 nm thick In0.12Ga0.88N layers, confined by GaN and In0.04Ga0.96N and containing a dense array of few nanometer size In-rich areas. The spectral features related to single QDs of the lateral size ∼3 and ∼30 nm and the QD ensemble have been identified. The regions of localization of the shallow and deep QD were spatially resolved in temperature dependent spectra. The spatial delocalization of the emission of the deep QDs at T<90 K have been observed.

Type
Research Article
Copyright
Copyright © Materials Research Society 2006

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References

[1] Chichibu, S. et al. Appl. Phys. Lett. 71, 2346 (1997);CrossRefGoogle Scholar
O'Donnell, K. P. et al. , Phys. Rev. Lett., 82, 237 (1999)CrossRefGoogle Scholar
[2] Krestnikov, I. L. et al. , Phys. Rev. B 66, 155310 (2002)CrossRefGoogle Scholar
[3] Sizov, D. S. et al. , “Nanostructures Physics and Technology”, St-Petersburg, June, 2005.Google Scholar
[4] Moriwaki, O. et al. Appl. Phys. Lett. 76, 2361 (2000);CrossRefGoogle Scholar
Robinson, J. W., et al. Appl. Phys. Lett. 83, 2674, (2003);CrossRefGoogle Scholar
Seguin, R. et al. Appl. Phys. Lett. 84, 4023 (2004);CrossRefGoogle Scholar
Schömig, H. et al. Phys. Rev. Lett. 92, 106802 (2004).CrossRefGoogle Scholar
[5] Mintairov, A. et al. , Phys. Rev. Lett. 87, 277401 (2001),CrossRefGoogle Scholar
Mintairov, A. et al. , Phys. Rev. B, 69, 155306 (2004).CrossRefGoogle Scholar
[6] Stepniewski, R. et al. , Phys. Rev. B 60, 4438 (1999).CrossRefGoogle Scholar
[7] Tawara, T. et al. , Phys. Rev. Lett. 92, 256402 (2004).CrossRefGoogle Scholar