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Nanoscale Observation of the Distribution Polarization in Lithium Niobate Thin Films

Published online by Cambridge University Press:  02 August 2012

Dmitry A. Kiselev ,
Roman N. Zhukov ,
Alexander S. Bykov ,
Mikhail D. Malinkovich  and
Yuriy N. Parkhomenko
Dmitry A. Kiselev
Affiliation:
National University of Science and Technology “MISiS”, 119049 Moscow, Leninskiy pr. 4, Russian Federation
Roman N. Zhukov
Affiliation:
National University of Science and Technology “MISiS”, 119049 Moscow, Leninskiy pr. 4, Russian Federation
Alexander S. Bykov
Affiliation:
National University of Science and Technology “MISiS”, 119049 Moscow, Leninskiy pr. 4, Russian Federation
Mikhail D. Malinkovich
Affiliation:
National University of Science and Technology “MISiS”, 119049 Moscow, Leninskiy pr. 4, Russian Federation
Yuriy N. Parkhomenko
Affiliation:
National University of Science and Technology “MISiS”, 119049 Moscow, Leninskiy pr. 4, Russian Federation
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Abstract

In this work, an Atomic Force Microscope in the so-called Piezoresponse mode and Kelvin mode is used to image the grains, ferroelectric domains and surface potential in lithium niobate thin films. A RF magnetron sputter system was used to deposit LiNbO3 thin films on (100)-oriented Si substrates with SiO2 layer. The surface of the sample shows small grains which diameter ranges from 70 nm to 150 nm and roughness is less than 13 nm. Using the electric field from a biased conducting AFM tip, we show that possible to form and subsequently to visualize ferroelectric state. Also, we report surface charge retention on ferroelectric thin films by Kelvin probe microscope in comparison with the piezoresponse signal.

Keywords

thin filmscanning probe microscopy (SPM)piezoresponse
Type
Articles
Information
MRS Online Proceedings Library (OPL) , Volume 1474: Symposium CCC – Local Probing Techniques and In-Situ Measurements in Materials Science , 2012 , mrss12-1474-ccc05-22
Copyright
Copyright © Materials Research Society 2012

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References

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