Hostname: page-component-78c5997874-xbtfd Total loading time: 0 Render date: 2024-11-06T01:11:42.251Z Has data issue: false hasContentIssue false

Nanocontact Measurements in Superlattices

Published online by Cambridge University Press:  26 February 2011

T. Baumann
Affiliation:
Brown Boveri Research Center, 5405 Baden, Switzerland
J. B. Pethica
Affiliation:
Brown Boveri Research Center, 5405 Baden, Switzerland
M. Grimsditch
Affiliation:
Materials Science Division, Argonne National Laboratory, Argonne, IL 60439
Ivan K. Schuller
Affiliation:
Materials Science Division, Argonne National Laboratory, Argonne, IL 60439
Get access

Abstract

Many metallic superlattices are known to exhibit dramatic anomalous elastic properties as a function of modulation wavelength. All measurements to date measure either a shear modulus or a longitudinal modulus in the superlattice plane. Here we present a method which also probes longitudinal elastic behavior perpendicular to the layers using a nano-hardness tester. In this method, a diamond tip is indented into the material and both the indentation depth and applied force are constantly monitored during loading and unloading. The elastic properties are extracted from the unloading part of the force versus displacement curve. Contrary to the anomaly found in a shear modulus, no anomaly in Young's modulus was found in the present study on Mo/Ni superlattices.

Type
Articles
Copyright
Copyright © Materials Research Society 1987

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

[1] For a review see, Schuller, I. K., IEEE 1985 Ultrasonics Symposium, edited by McAvoy, B. R. (IEEE, New York), p. 1093.Google Scholar
[2] Khan, M. R., Chun, C. S. L., Felcher, G. P., Grimsditch, M., Kueny, A., Falco, C. M. and Schuller, I. K., Phys. Rev. B27, 7186 (1983).Google Scholar
[3] Schuller, I. K. and Rahman, A., Phys. Rev. Lett. 50, 1377 (1983).Google Scholar
[4] Bisanti, P., Brodsky, M., Felcher, G., Grimsditch, M. and Sill, L. R. (in press).Google Scholar
[5] Grimsditch, M. (in these proceedings).Google Scholar
[6] Pethica, J. B., Hutchings, R. and Oliver, W. C., Phil. Mag. A 48, 593 (1983).CrossRefGoogle Scholar
[7] Oliver, W. C., MRS Bulletin, September/October 1986, p. 15.CrossRefGoogle Scholar
[8] Doerner, M. F. and Nix, W. D., J. Mat. Research, July/August 1986, p.601.CrossRefGoogle Scholar
[9] Loubet, J. L., Georges, J. M. and Mei lie, G., in “Microindentation Techniques in Materials Science and Engineering”, eds. Blau, P. B. and Lawn, B., ASTM Philadelphia 1985, pp. 7289.Google Scholar
[10] C Oliver, W. and Pettica, J. R., to be published and W. C. Oliver paper GP15 this meeting.Google Scholar