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Nanoanalytical Characterization of Granular Ag-Fe Films with Giant Magnetoresistance

Published online by Cambridge University Press:  21 February 2011

J. Liu
Affiliation:
Center for Solid State Science, Arizona State University, Tempe, AZ 85287
Z. G. Li
Affiliation:
Du Pont Company., P. 0. Box 80356, Wilmington, DE 19880
H. Wan
Affiliation:
Department of Physics and Astronomy, University of Delaware, Newark, DE 19716
A. Tsoukatos
Affiliation:
Department of Physics and Astronomy, University of Delaware, Newark, DE 19716
G. C. Hadjipanayis
Affiliation:
Department of Physics and Astronomy, University of Delaware, Newark, DE 19716
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Abstract

Dedicated scanning transmission electron microscopy and associated techniques were used to extract microstructural and compositional information about granular Ag-Fe magnetic films produced by sputtering. Nanometer-resolution compositional analysis by energy dispersive X-ray spectroscopy (EDS), showed that Ag-Fe granular films consist of two separate phases. It has been found that nanometer size Fe particles are separated by small as well as large Ag particles. Nanodiffraction patterns showed that a large proportion of small Ag particles have an icosahedral shape and that the Fe particles are highly disordered. The nanostructure of the Ag-Fe system and its relation to the giant magnetoresistance of granular films are discussed.

Type
Research Article
Copyright
Copyright © Materials Research Society 1994

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References

REFERENCES

[1] Berkowitz, A.E., Mitchell, J.R., Carey, M.J., Young, A.P., Zhang, S., Spada, F.E., Parker, F.T., Hutten, A. and Thomas, G., Phys. Rev. Lett. 68, 3745 (1992).CrossRefGoogle Scholar
[2] Xiao, J. Q., Jiang, J. S. and Chien, C. L., Phys. Rev. Lett. 68, 3749 (1992).CrossRefGoogle Scholar
[3] Xiao, G., Wang, J. Q. and Xiong, P., Appl. Phys. Lett. 62, 420 (1993).CrossRefGoogle Scholar
[4] Tsoukatos, A., Wan, H., Hadjipanayis, G.C., Unruh, K.M. and Li, Z.G., J. Appl. Phys. 73, 5509 (1993).Google Scholar
[5] Wan, H., Tsoukatos, A., Hadjipanayis, G.C., Li, Z.G., Liu, J., Phys. Rev. B. (Dec., 1993).Google Scholar
[6] Li, Z.G., Wan, H., Liu, J., Tsoukatos, A., Hadjipanayis, G.C. and Liang, L., Appl. Phys. Lett. (Dec., 1993).Google Scholar
[7] Watson, M.L., Banard, J.A., Hossain, S., Parker, M.R., J. Appl. Phys. 73, 5506 (1993).Google Scholar
[8] Zhang, S. and Levy, P. M., J. Appl. Phys. 73, 5315 (1993).CrossRefGoogle Scholar
[9] Tsoukatos, A., Wan, H., Hadjipanayis, G.C., Li, Z.G., Appl. Phys. Lett. 61, 3059 (1992).Google Scholar
[10] Liu, J. and Cowley, J. M., Ultramicroscopy 34, 119 (1990);, 37, 50 (1991).Google Scholar
[11] Liu, J., Pan, M. and Spinnler, G. E., Proc. 51st MSA Meeting (1993) pp. 10581059.Google Scholar