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Multiparameter Imaging and Understanding the Role of the Tip - Atomic Resolution Images of Rutile TiO2 (110)

Published online by Cambridge University Press:  09 March 2011

S. J. O’Brien ,
H. Ozgur Ozer ,
G. L. W. Cross  and
J. B. Pethica
S. J. O’Brien
Affiliation:
Centre for Research on Adaptive Nanostructures and Nanodevices (CRANN) and School of Physics, Trinity College, Dublin 2, Ireland
H. Ozgur Ozer
Affiliation:
Centre for Research on Adaptive Nanostructures and Nanodevices (CRANN) and School of Physics, Trinity College, Dublin 2, Ireland
G. L. W. Cross
Affiliation:
Centre for Research on Adaptive Nanostructures and Nanodevices (CRANN) and School of Physics, Trinity College, Dublin 2, Ireland
J. B. Pethica
Affiliation:
Centre for Research on Adaptive Nanostructures and Nanodevices (CRANN) and School of Physics, Trinity College, Dublin 2, Ireland
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Abstract

A major challenge for scanned probe microscopy is to identify structures and chemical species on a surface, which have not already been inferred from other analytical techniques. Progress is impeded by the fact that in general the structure and composition of the tip atom is not known. To illustrate some of the issues involved, we report simultaneous scanning tunneling microscopy/atomic force microscopy (STM/AFM) of the TiO2 (110) surface. The use of small amplitudes enabled the simultaneous acquisition of force gradient and barrier height images during standard STM imaging. Surprisingly, we find most STM images exhibit a corrugation contrast inverse to that usually reported in the literature. However, regardless of the contrast in STM, force gradient images always showed greater attraction over O rows. Barrier height images also show this consistency, always being greater over O rows. This supports the theoretical model of the electronic structure of the surface, but shows that the tip structure and interaction cannot be ignored in modeling STM images. We conclude that there is a fine balance between topography and local density of states (LDOS) in STM imaging of this surface; which of them dominates the STM image is determined by the tip. Simultaneous multi-parameter imaging is useful in interpreting images reliably, particularly on multi-component surfaces.

Keywords

scanning tunneling microscopy (STM)scanning probe microscopy (SPM)surface chemistry
Type
Articles
Information
MRS Online Proceedings Library (OPL) , Volume 1318: Symposium SS/TT/UU/VV – Advances in Spectroscopy and Imaging of Surfaces and Nanostructures , 2011 , mrsf10-1318-vv09-01
Copyright
Copyright © Materials Research Society 2011

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References

REFERENCES

[1] Sugimoto, Y., Pou, P., Abe, M., Jelinek, P., Perez, R., Morita, S., and Custance, O., Nature 446, 64, (2007).Google Scholar
[2] Ozer, H. O., O’Brien, S. J., and Pethica, J. B., Appl. Phys. Lett. 90, 133110 (2007).Google Scholar
[3] Pang, C. L., Sasahara, A., Onishi, H., Chen, Q., and Thornton, G., Phys. Rev. B 74, 073411 (2006).Google Scholar
[4] Sawada, D., Sugimoto, Y., Morita, K.-I., Abe, M., and Morita, S., Appl. Phys. Lett. 94, 173117, (2009).Google Scholar
[5] Diebold, U., Surf. Sci. Rep. 48, 53 (2003).Google Scholar
[6] Diebold, U., Anderson, J. F., Ng, K.-O., and Vanderbilt, D., Phys. Rev. Lett. 77, 1322, (1996).Google Scholar
[7] Fischer, S., Munz, A. W., Schierbaum, K.-D., and Gopel, W., Surf. Sci. 337, 17 (1995).Google Scholar
[8] Mitchell, C. J., Howard, A., Carney, M., and Egdell, R. G., Surf. Sci. 490, 196 (2001).Google Scholar
[9] Diebold, U., Lehman, J., Mahmoud, T., Kuhn, M., Leonardelli, G., Hebenstreit, W., Schmid, M., and Varga, P., Surf. Sci. 411, 137 (1998).Google Scholar
[10] Doyen, G., Drakova, D., and Scheffler, M., Phys. Rev. B 47, 9778 (1993).Google Scholar
[11] Jelınek, P., Svec, M., Pou, P., Perez, R., and Chab, V., Phys. Rev. Lett. 101, 1, (2008).Google Scholar
[12] Nieminen, J., Niemi, E., and Rieder, K., Surf. Sci. 552, 47 (2004).Google Scholar
[13] Hofer, W. A., Fisher, A. J., Wolkow, R. A., and Grutter, P., Phys. Rev. Lett. 87, 236104 (2001).Google Scholar
[14] Blanco, J. M., Gonzalez, C., Jelinek, P., Ortega, J., Flores, F., and Perez, R., Phys. Rev. B 70, 085405 (2004).Google Scholar
[15] Blanco, J. M., Gonzalez, C., Jelınek, P., Ortega, J., Flores, F., Perez, R., Rose, M., Salmeron, M., Mendez, J., Wintterlin, J., and Ertl, G., Phys. Rev. B 71, 4 (2005).Google Scholar
[16] Oral, A., Grimble, R., Ozer, H. O., and Pethica, J. B., Rev. Sci. Inst. 74, 3656 (2003).Google Scholar
[17] Pethica, J. B., Knall, J., and Wilson, J. H., Inst. Phys. Conf. Ser. 134, 597 (1993).Google Scholar
[18] Herz, M., Schiller, C., Giessibl, F. J., and Mannhart, J., Appl. Phys. Lett. 86, 153101 (2005).Google Scholar
[19] Ostermann, D., Walther, G., and Schierbaum, K. D., Phys. Rev. B 71, 235416 (2005).Google Scholar
[20] Cross, G., Schirmeisen, A., Stalder, A., Grutter, P., Tschudy, M., and Durig, U., Phys. Rev. Lett. 80, 4685 (1998).Google Scholar
[21] Tersoff, J. and Hamann, D., Phys. Rev. Lett., 50, 1998–2001, (1983)Google Scholar
[22] Dunphy, J.C., Ogletree, D.F., Salmeron, M.B., Sautet, P., Bocquet, M.-L. and Joachim, C., Ultramicroscopy 42-44, 490, (1992).Google Scholar
[23] Coombs, J.H. and Pethica, J.B., IBM J.Res & Dev., 30, 455–459, (1986).Google Scholar
[24] Enevoldsen, G. H., Pinto, H. P., Foster, A. S., Jensen, M. C. R., Kuhnle, A., Reichling, M., Hofer, W. A., Lauritsen, J. V., and Besenbacher, F., Phys. Rev. B 78, 045416 (2008).Google Scholar