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Multimodal Time Delays in the Photoplasticity of Mercury Cadmium Telluride

Published online by Cambridge University Press:  26 February 2011

Joseph Pellegrino
Affiliation:
The University of Connecticut, Department of Metallurgy and Institute of Materials Science, Storrs, CT 06268.
Julian P. Partridge
Affiliation:
The University of Connecticut, Department of Metallurgy and Institute of Materials Science, Storrs, CT 06268.
Yo Ho Son
Affiliation:
The University of Connecticut, Department of Metallurgy and Institute of Materials Science, Storrs, CT 06268.
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Abstract

The plastic response of deforming crystals of mercury cadmium telluride to light occurs with a time delay that depends on wavelength, temperature, and bias voltage. The time delay exhibits a temperature dependence which increases as the temperature is lowered, andis approximately 60 seconds at 20°C. A detailed examination of a number of measurements of the time delay at constant temperature reveals that the time delay falls into one of four separate peaks. These peaks shift with temperature with an overall activation energy of approximately 0.2 eV. Furthermore, the photoplastic responses of a given crystal indicate that softening is observed roughly 40% of the time and hardening the remaining 60%. It has also been observed that the relative positions of the time delay peaks can be markedly affected by a static bias voltage.

A model which explains these observations involves the coulombic interaction of charged point defects with jogs on dislocations. The model predicts four separate time delay peaks as well as the correct ratio of hardening to softening.

Type
Research Article
Copyright
Copyright © Materials Research Society 1987

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References

REFERENCES

1. Osipyan, A. and Savchenko, I. B.. Soviet Physics J.E.T.P. Letters, 7, 100 (1968).Google Scholar
2. Carlsson, L. and Svensen, C., J. Appl. Phys., 41, 1652 (1970).Google Scholar
3. Carlsson, L., J. Appl. Phys., 42, 676 (1971).Google Scholar
4. Pellegrino, J. and Galligan, J. M., J. Vac. Sci. Tech., 3, 160 (1985).CrossRefGoogle Scholar
5. Mayer, V. F. and Galligan, J. M., Appl. Phys. Lett., 40, 1020 (1982).CrossRefGoogle Scholar
6. Petrenko, V. F. and Whitworth, R. W., Phil. Mag., A41, 681 (1980).CrossRefGoogle Scholar
7. Pellegrino, J. and Galligan, J. M., J. Mat. Res., 1, 3 (1986).CrossRefGoogle Scholar
8. Hirth, J. P. and Ehrenreich, H., J. Vac. Sci. Tech., 3, 368 (1985).Google Scholar
9. Pellegrino, J. and Galligan, J. M., Appl. Phys. Lett., 48, 1127 (1986).Google Scholar
10. Figielski, T., Solid State Electronics, 21, 1403 (1978).CrossRefGoogle Scholar
11. Chen, J. C., Private Communication.Google Scholar