Hostname: page-component-669899f699-tzmfd Total loading time: 0 Render date: 2025-04-26T00:04:30.930Z Has data issue: false hasContentIssue false
  • English
  • Français

Mombe Growth of Ybco Superconducting Films With In-Situ Monitoring of Rheed Oscillations

Published online by Cambridge University Press:  22 February 2011

K. Endo ,
F. Hosseini Teherani ,
S. Yoshida ,
K. Kajimura  and
Y. Moriyasu
K. Endo
Affiliation:
Electrotechnical Laboratory, Tsukuba, Ibaraki 305, Japan
F. Hosseini Teherani
Affiliation:
Electrotechnical Laboratory, Tsukuba, Ibaraki 305, Japan
S. Yoshida
Affiliation:
Electrotechnical Laboratory, Tsukuba, Ibaraki 305, Japan
K. Kajimura
Affiliation:
Electrotechnical Laboratory, Tsukuba, Ibaraki 305, Japan
Y. Moriyasu
Affiliation:
Asahi Chemical Ind., Fuji, Shizuoka 416, Japan
Get access

Abstract

We have succeeded in in-situ growth of YBCO superconducting films by developing a new MOMBE technique which employs in-situ monitoring of RHEED intensity. The X-ray diffraction pattern showed peaks corresponding to those calculated from the Laue function which indicates the high quality of films grown using MOMBE. AFM and RHEED oscillations show 2-dimensional unit cell by unit cell growth.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 334: Symposium W – Gas-Phase and Surface Chemistry in Electronic Materials Processing , 1993 , 543
Copyright
Copyright © Materials Research Society 1994

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

Article purchase

Temporarily unavailable

References

references

[1] Endo, K., Ikedo, Y., Hayashida, S., Ishiai, J., Nakatsuka, N., Misawa, S. and Yoshida, S., in Ishiguro, T. and Kajimura, K. (eds.), “Advances in Superconductivity II” Springer, Tokyo (1990) p. 805.CrossRefGoogle Scholar
[2] Yokoyama, Y., Okumura, T., Sugise, R., Matsubara, T., Koshizuka, N., Hirabayashi, M., Terada, N. and Ihara, H., J. Ceram. Soc. Jpn. Int., 96 (1988) p. 481.Google Scholar
[3] Endo, K., Saya, S., Misawa, S. and Yoshida, S., Thin Solid Films, 206 (1991) p. 143.Google Scholar