Hostname: page-component-586b7cd67f-r5fsc Total loading time: 0 Render date: 2024-11-25T18:34:35.321Z Has data issue: false hasContentIssue false
  • English
  • Français

Modulating Functions Waveform Analysis of Multi-Exponential Transients for Deep-Level Transient Spectroscopy

Published online by Cambridge University Press:  25 February 2011

C. M. Ransom ,
T. I. Chappell ,
J. L. Freeouf  and
P. D. Kirchner
C. M. Ransom
Affiliation:
IBM Corporation, T.J. Watson Research Center, Yorktown Heights, N.Y. 10598
T. I. Chappell
Affiliation:
IBM Corporation, T.J. Watson Research Center, Yorktown Heights, N.Y. 10598
J. L. Freeouf
Affiliation:
IBM Corporation, T.J. Watson Research Center, Yorktown Heights, N.Y. 10598
P. D. Kirchner
Affiliation:
IBM Corporation, T.J. Watson Research Center, Yorktown Heights, N.Y. 10598
Get access

Abstract

An improved method for the analysis of multi-exponential transients with high resolution has been applied to DLTS. Full-waveform fittings, using the technique of Modulating Functions, are made to digitized transients captured by a computer. This technique is described and results for both simulated data (with noise) and real data are shown. The advantages over previously published techniques in resolution, calculation speed, insensitivity to truncation error and noise are discussed. Also, how this method allows for a determination of the number of components is presented.

Type
Articles
Information
MRS Online Proceedings Library (OPL) , Volume 69: Symposium D – Materials Characterization , 1986 , 337
Copyright
Copyright © Materials Research Society 1986

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Lang, D., J. Appl. Phys., 45, 3023 (1974).Google Scholar
2. Miller, G.L., Ramirez, J.V. and Robinson, D.A.H., 46, 2638 (1975).Google Scholar
3. Okushi, H. and Tokumaru, Y., Jpn. J. Appl. Phys., 19, L335 (1980).Google Scholar
4. Stannard, J.E., Day, H.M., Bark, M.L. and Lee, S.H., Solid-State Electronics, 24, 1009 (1981).Google Scholar
5. Isenberg, I., J. Biophysical Society, 43, 141 (1983).Google Scholar
6. McKinnon, A.E., Szabo, A.G. and Miller, D.R., J. of Physical Chemistry, 81, 1564 (1977).Google Scholar
7. O'Connor, D.V., Ware, W.R. and Andre, J.C., J. of Physical Chemistry, 83, 1333 (1979).Google Scholar
8. Isenberg, I. and Dyson, R.D., Biophysical Journal, 9, 1337 (1969).Google Scholar
9. Loeb, J.M. and Cohen, G.M., IEEE Trans. on Automation Control, 10, 359 (1965).Google Scholar
10. Valeur, B., Chem. Physics, 30, 85 (1978).Google Scholar
11. Eisenfeld, J. and Cheng, S.W., Applied Math. and Computation, (1979).Google Scholar
12. Kirchner, P.D., Schaff, W.J., Marcas, G.N., Eastman, L.E., Chappell, T.I. and Ransom, C.M., J. Appl. Phys., 52,6462 (1981).Google Scholar
13. Chappell, T.I. and Ransom, C.M., Rev. Sci. Instrum., 55,200 (1984).CrossRefGoogle Scholar