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Modelling and Measurements of Stress-Controlled Interdiffusion in Multilayered Amorphous Alloys

Published online by Cambridge University Press:  21 February 2011

F. L. Yang ,
W. C. Shih  and
A. L. Greer
F. L. Yang
Affiliation:
University of Cambridge, Department of Materials Science & Metallurgy, Pembroke Street, Cambridge CB2 3QZ, United Kingdom
W. C. Shih
Affiliation:
University of Cambridge, Department of Materials Science & Metallurgy, Pembroke Street, Cambridge CB2 3QZ, United Kingdom
A. L. Greer
Affiliation:
University of Cambridge, Department of Materials Science & Metallurgy, Pembroke Street, Cambridge CB2 3QZ, United Kingdom
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Abstract

The decay of X-ray satellite intensities is used to measure interdiffusion in amorphous Ni55Zr45 multilayers as a function of repeat distance, time and temperature. The data are compared to analytical expressions and a numerical simulation based on the analysis of Stephenson for stress effects. It is concluded that stress effects are very strong and that the analysis fits them quantitatively in a system such as a-Ni-Zr with marked diffusional asymmetry.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 356: Symposium B2 – Thin Films: Stresses and Mechanical Properties V , 1994 , 21
Copyright
Copyright © Materials Research Society 1995

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