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A Model for the Application of Dlts on Normally-on Hemt Structures

Published online by Cambridge University Press:  26 February 2011

Y. J. Huang  and
D. E. Ioannou
Y. J. Huang
Affiliation:
Joint Program for Advanced Electronic Materials, Electrical Engineering Department, University of Maryland, College Park, MD 20742 and Laboratory for Physical Sciences, College Park, Maryland 20742
D. E. Ioannou
Affiliation:
Joint Program for Advanced Electronic Materials, Electrical Engineering Department, University of Maryland, College Park, MD 20742 and Laboratory for Physical Sciences, College Park, Maryland 20742
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Abstract

This paper presents an analytical model for the application of capacitance DLTS on the normally-on HEMT structure. Based on the charge conservation law, the DLTS signal is derived by taking into account both the Schottky gate and the heterojunction depletion layer capacitances. It is shown that the anomalous features observed by using the conventional DLTS technique on a HEMT structure can be reasonably explained with this model. Some results obtained by simulation of typical measurements are presented, which confirm our conclusions.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 82: Symposium I – Characterization of Defects in Materials , 1986 , 145
Copyright
Copyright © Materials Research Society 1987

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References

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