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Mimicking the Real World and Exploring New Ones with In-Situ Electron Microscopy

Published online by Cambridge University Press:  15 February 2011

A. Howie
A. Howie*
Affiliation:
Cavendish Laboratory, Madingley Road, Cambridge CB3 OHE, UK, [email protected]
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Abstract

Recent progress with in-situ observations by electron microscopy is briefly surveyed by referring to developments in instrumentation for reflection and low energy electron imaging as well as for high resolution transmission imaging and spectroscopy. New opportunities have been opened up by environmental microscopy. With increased levels of illumination intensity, the ever present question of beam-induced effects is of mounting concern particularly in studies of non-metallic materials.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 404: Symposium J – In Situ Electron and Tunneling Microscopy of Dynamic Processes , 1995 , 9
Copyright
Copyright © Materials Research Society 1996

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