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Microwave Photoconductivity Measurements to Characterize Semiconductors
Published online by Cambridge University Press: 28 February 2011
Abstract
After a general survey of characterization techniques the use of transient photoconductivity measurements in the microwave frequency range for the characterization of semiconductors and semiconductor devices for (opto)electronic applications is treated. Experimental details and applications of these measurements are given.
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- Copyright © Materials Research Society 1991
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