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Microwave Photoconductivity Measurements to Characterize Semiconductors

Published online by Cambridge University Press:  28 February 2011

M. Kunst
M. Kunst*
Affiliation:
Hahn-Meitner Institut, Solare Energetik, D - 1000 Berlin 39, West Germany
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Abstract

After a general survey of characterization techniques the use of transient photoconductivity measurements in the microwave frequency range for the characterization of semiconductors and semiconductor devices for (opto)electronic applications is treated. Experimental details and applications of these measurements are given.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 189: Symposium L – Microwave Processing of Materials II , 1990 , 75
Copyright
Copyright © Materials Research Society 1991

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References

REFERENCES

1. Sanders, A., Wetzel, H. and Kunst, M., accompanying paper in this volumeGoogle Scholar
2. Kunst, M. and Beck, G., J. Appl. Phys. 63, 1093 (1988)Google Scholar