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Microstructure of In-Situ Grown YBa2Cu4O8 Thin Films Deposited by MOCVD

Published online by Cambridge University Press:  26 February 2011

K. Uehara
Affiliation:
Superconductivity Research Laboratory, ISTEC, 10–13 Shinonome 1-chome, Koto-ku. Tokyo 135., Japan
H. Sakai
Affiliation:
Superconductivity Research Laboratory, ISTEC, 10–13 Shinonome 1-chome, Koto-ku. Tokyo 135., Japan
H. Hayashi
Affiliation:
Central Research Laboratory, Kyocera Corporation, 1–4 Yamashita-cho, Kokubu-shi, Kagoshima 899–43, Japan
Y. Shiohara
Affiliation:
Superconductivity Research Laboratory, ISTEC, 10–13 Shinonome 1-chome, Koto-ku. Tokyo 135., Japan
S. Tanaka
Affiliation:
Superconductivity Research Laboratory, ISTEC, 10–13 Shinonome 1-chome, Koto-ku. Tokyo 135., Japan
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Abstract

High-resolution transmission electron microscopy (HREM) has been used to study the microstructures of Y-Ba-Cu-0 superconducting thin films in which the YBa2Cu4O8 phase was the main phase. From cross-sectional observations, the c-normal 123 phase predominated in the film near the substrate surface, while the c-normal 124 phase occupied the region near the film surface. Another remarkable microstructure was that a-normal 123 variants overcame the c-normal 123 region, but the c-normal 124 phase surpassed the a-normal 123 phase in the upper part of the film.

Type
Research Article
Copyright
Copyright © Materials Research Society 1992

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References

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