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Microstructure and Temperature Dependence of Microwave Penetration Depth of Ag-YBa2Cu3O7-δ Thin Films

Published online by Cambridge University Press:  15 February 2011

Davinder Kaur  and
R. Pinto
Davinder Kaur
Affiliation:
Tata Institute of Fundamental Research, Homi Bhabha Road, Mumbai-400 005, India
R. Pinto
Affiliation:
Tata Institute of Fundamental Research, Homi Bhabha Road, Mumbai-400 005, India
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Abstract

We report the measurements of the magnetic penetration depth λ(T) of Ag-doped YBa2Cu3O7-δ (YBCO) thin films in the film thickness range 1500-4000A and temperature range 18-88K. The films are insitu grown by laser ablation on LaAlO3 <100> single crystal substrates. The penetration depth measurements are performed by microstrip resonator technique. A correlation of λ(T) with the film microstructure observed with Atomic Force Microscopy has shown that λ(T) depends critically on the film microstructure. Temperature dependence of λ(T) has also been studied for best quality films.The experimental results are discussed in terms of BCS theory (s-wave pairing) and d-wave Pairing with and without impurity scattering. The results are found to be best fitted to the d-wave model in dirty limit with impurity scattering. Near Tc, we have also compare the (3D) XY critical regime and the Ginzburg-Landau (GL) behaviour.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 526: Symposium Y – Advances in Laser Ablation of Materials , 1998 , 275
Copyright
Copyright © Materials Research Society 1998

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