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Microstructure and Properties of Mixed Yba2Cu3O7-X and Y2Ba4Cu8O16 Thin Films

Published online by Cambridge University Press:  28 February 2011

A.F. Marshall ,
A. Kapitulnik ,
K. Char  and
R.W. Barton
A.F. Marshall
Affiliation:
Center for Materials Research and Dept. of Applied Physics, Stanford University, Stanford, CA 94305
A. Kapitulnik
Affiliation:
Center for Materials Research and Dept. of Applied Physics, Stanford University, Stanford, CA 94305
K. Char
Affiliation:
Conductus, Inc., Sunnyvale, CA 94086
R.W. Barton
Affiliation:
Conductus, Inc., Sunnyvale, CA 94086
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Abstract

Post-annealed thin films comprised of mixed YBa2Cu3O7-x (123) and Y2Ba4Cu8O16 (248) phases with both faulted and unfaulted microstructures have been characterized by planar and cross-section transmission electron microscopy. The influence of 248-type faults on the 123 structure, possible mechanisms for the higher Tc's of faulted films, and observations of a fourfold ordered structure are discussed.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 169: Symposium M – High Temperature Superconductors: Fundamental Properties and Novel Materials Processing , 1989 , 785
Copyright
Copyright © Materials Research Society 1990

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References

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