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Microstructural Size and Alignment Effects on the Dielectric Response of Inhomogeneous Media

Published online by Cambridge University Press:  10 February 2011

Kim F. Ferris ,
Gregory J. Exarhos  and
Steven M. Risser
Kim F. Ferris
Affiliation:
Pacific Northwest National Laboratory, Materials and Chemical Sciences Center, Richland, WA 99352
Gregory J. Exarhos
Affiliation:
Pacific Northwest National Laboratory, Materials and Chemical Sciences Center, Richland, WA 99352
Steven M. Risser
Affiliation:
Texas A&M University-Commerce, Department of Physics, Commerce, TX 75429
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Abstract

The dielectric response of inhomogeneous media presents a complex boundary problem dependent upon dielectric susceptibility and volume fraction of its components, as well as the physical size of the heterogeneities. In this paper, we have used the LOCALF method to examine the size dependent problem for cubic and columnar defects for ZrO2 dielectric films of varying microstructure size and volume fraction. Both the alignments of low dielectric components with respect to the applied field and their size can effectively modulate the composite response. Comparison of these results with the conventional effective medium approximation methods reinforces the need to include microstructural detail in the modeling approach.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 492: Symposium S – Microscopic Simulation of Interfacial Phenomena in Solids… , 1997 , 331
Copyright
Copyright © Materials Research Society 1998

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References

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