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Microstructural Characterization of Sintered Ba(Mg ⅓ Ta ⅔)O3 Materials by Transmission Electron Microscopy and Convergent Beam Electron Diffraction

Published online by Cambridge University Press:  01 February 2011

J. W. Steeds  and
I-N. Lin
J. W. Steeds
Affiliation:
Physics Department, University of Bristol, Bristol BS8 1TL, United Kingdom
I-N. Lin
Affiliation:
Materials Science Center, National Tsing-Hua University, Taiwan, R.O.C
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Abstract

Development of high performance dielectric materials is required to facilitate the trend towards miniaturization of microwave communications circuits. A novel two-step sintering process has been found that enhances the value of (Q-factor) (frequency) (QF)product of Ba(Mg ⅓ Ta ⅔)O3 (BMT). Detailed examination of samples densified in this way gives not only details of the grain size, defect content and state of order of the ordered perovskite grains but also reveals the presence of a number of previously unreported phases. These new phases have been examined by TEM using energy dispersive X-ray analysis to give them approximate chemical composition and convergent beam electron diffraction to determine their crystallography. Large unit cells are found which are evidently related to compounds studied previously in the x 3 BaMnO - system. The results will be discussed in relation to the enhanced performance of the materials.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 718: Symposium D – Perovskite Materials , 2002 , D10.24
Copyright
Copyright © Materials Research Society 2002

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