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Microstructural Analysis of Hexagonal Close-Packed Metals Using X-Ray Diffraction and Transmission Electron Microscopy
Published online by Cambridge University Press: 26 February 2011
Abstract
The techniques employed for X-ray diffraction analysis of dislocation substructures in hexagonal close-packed metals are descibed and assessed by comparison with direct observations using transmission electron microscopy.
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- Copyright © Materials Research Society 1991
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