Hostname: page-component-cd9895bd7-dzt6s Total loading time: 0 Render date: 2024-12-27T02:11:40.436Z Has data issue: false hasContentIssue false
  • English
  • Français

Micromechanical Properties of He-Implanted Ni

Published online by Cambridge University Press:  11 February 2011

J. A. Knapp ,
D. M. Follstaedt  and
S. M. Myers
J. A. Knapp
Affiliation:
Sandia National Laboratories, Albuquerque, NM 87185–1056
D. M. Follstaedt
Affiliation:
Sandia National Laboratories, Albuquerque, NM 87185–1056
S. M. Myers
Affiliation:
Sandia National Laboratories, Albuquerque, NM 87185–1056
Get access

Abstract

Detailed finite-element modeling of nanoindentation data is used to obtain the micromechanical properties of Ni implanted with ∼5 at.% He to a depth of 600–700 nm. Properties of He-containing metals have implications for studies of radiation damage and for fundamental issues of dislocation pinning. Cross-section TEM shows the implantation produces a highly damaged layer containing a fine dispersion of He bubbles with diameters of ∼1 nm or smaller, with some evidence for interconnection between bubbles. Nanoindentation of the Ni(He) layers gave a fairly hard, stiff response to depths of 100–120 nm, beyond which the layer failed. By modeling the layer as an isotropic, elastic-plastic solid with the Mises yield criterion, the Ni(He) is shown to have a hardness nearly 7 times that of untreated Ni. However, unlike other treatments that we have used to produce very hard Ni-based layers, the Ni(He) layer fails at relatively modest shear stress levels.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 750: Symposium Y – Surface Engineering 2002–Synthesis, Characterization and Applications , 2002 , Y6.10
Copyright
Copyright © Materials Research Society 2003

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Knapp, J.A., Follstaedt, D.M., Myers, S.M., Barbour, J.C. and Friedmann, T.A., J. Appl. Phys. 85, 1460 (1999).Google Scholar
2. Knapp, J.A., Follstaedt, D.M. and Myers, S.M., proceedings of IMECE 02, in press.Google Scholar
3. The ion ranges were calculated using the TRIM Monte Carlo code described by Ziegler, J.F., Biersack, J.P., and Littmark, U., The Stopping and Range of Ions in Solids, Pergamon, New York; 1985; the employed version was SRIM-2000.40, provided by J.F. Ziegler (private communication).Google Scholar
4. Oliver, W.C. and Pharr, G.M., J. Mater. Res. 7, 1564 (1992).Google Scholar
5. ABAQUS version 5.8, Hibbitt, Karlsson & Sorensen, Inc., Pawtucket, RI.Google Scholar
6. Metals Handbook, 1990, ASM, Metals Park, Ohio, 2, pp. 437, 1143.Google Scholar
7. Atlas of Stress-Strain Curves, 1987, edited by Boyer, H. E., ASM, Metals Park, Ohio, p. 551.Google Scholar
8. Myers, S.M. and Follstaedt, D.M., J. Appl. Phys. 86, 3048 (1999).Google Scholar
9. Knapp, J.A., Myers, S.M., Follstaedt, D.M. and Petersen, G.A., J. Appl. Phys. 86, 6547 (1999).Google Scholar