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Microanalysis of Calcium-Aluminosilicate Glass Films Grown on α-Al2O3 by Pulsed-Laser Ablation

Published online by Cambridge University Press:  01 January 1992

Michael P. Mallamaci ,
James Bentley  and
C. Barry Carter
Michael P. Mallamaci
Affiliation:
Department of Chemical Engineering and Materials Science, University of Minnesota, 421 Washington Ave. SE, Minneapolis, MN 55455–0132
James Bentley*
Affiliation:
Department of Chemical Engineering and Materials Science, University of Minnesota, 421 Washington Ave. SE, Minneapolis, MN 55455–0132
C. Barry Carter
Affiliation:
Department of Chemical Engineering and Materials Science, University of Minnesota, 421 Washington Ave. SE, Minneapolis, MN 55455–0132
*
* Metals and Ceramics Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831–6376
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Abstract

Pulsed-laser ablation has been used to deposit amorphous calcium-aluminosilicate films on α-Al2O3 single-crystal substrates. The microstructure and composition of each glass film was characterized using analytical electron microscopy (AEM). Composition was dependent on substrate temperature during deposition and thickness of the deposited glass layer.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 285: Symposium I – Laser Ablation in Materials Processing–Fundamentals and Applications , 1992 , 433
Copyright
Copyright © Materials Research Society 1993

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References

REFERENCES

1. Lowndes, D.H., Proc. 8th International Summer School on Crystal Growth, in press.Google Scholar
2. Kotula, P.G., B.S. Thesis, Cornell University, 1991.Google Scholar
3. Susnitzky, D.W. and Carter, C.B., J. Am. Cer. Soc. 75, 2463 (1992).Google Scholar
4. Simpson, Y.K., Carter, C.B., Morrissey, K.J., Angelini, P., and Bentley, J., J. Mat. Sci. 21, 2689 (1986).Google Scholar
5. Zaluzec, N.J., ch. 4 in Introduction to Analytical Electron Microscopy, eds. Hren, J.J. et al. (Plenum Press, New York, 1979).Google Scholar
6. Williams, D.B., Practical Analytical Electron Microscopy in Materials Science. (Philips Electronic Instruments, Inc., Electron Optics Publishing Group, Mahwah, New Jersey, 1984), pp. 67–89.Google Scholar
7. Kelly, P.M. et al., Phys. Stat. Sol. (a) 31, 771 (1975).Google Scholar
8. Bentley, J., in Transmission Electron Energy Loss Spectrometry in Materials Science, eds. Disko, M.M. et al. (The Minerals, Metals and Materials Society, Warrendale, PA, 1992),pp. 155–181.Google Scholar
9. Norton, M.G. (private communication).Google Scholar