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A Method For The Tem Characterisation Of Grain Boundary Films In Ceramics

Published online by Cambridge University Press:  15 February 2011

N.W. Jepps ,
T. F. Page  and
W. M. Stobbs
N.W. Jepps
Affiliation:
Department of Metallurgy and Materials Science,University of Cambridge, Pembroke Street, Cambridge, CB2 3QZ, England
T. F. Page
Affiliation:
Department of Metallurgy and Materials Science,University of Cambridge, Pembroke Street, Cambridge, CB2 3QZ, England
W. M. Stobbs
Affiliation:
Department of Metallurgy and Materials Science,University of Cambridge, Pembroke Street, Cambridge, CB2 3QZ, England
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Abstract

The behaviour of Fresnel fringes with focus has been investigated as a means of characterising grain boundaries in engineering ceramics. This technique, together with dark-field imaging, has been applied to the study of grain boundaries in two hot-pressed silicon carbides. It is demonstrated that these two techniques, applied together, provide the best means of obtaining a complete characterisation of grain boundary films, in terms of width, structure, and composition.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 5: Symposium B – Grain Boundaries in Semiconductors , 1981 , 45
Copyright
Copyright © Materials Research Society 1982

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References

REFERENCES

1. Clarke, D.R. and Thomas, G., J. Am. Ceram. Soc. 60, 491 (1977).Google Scholar
2. Kirn, M., Ruhle, M., Schmid, H. and Gauckler, L.J., Proc. Ninth Int. Cong. E.M. (Toronto) 302 (1978).Google Scholar
3. Lou, L.K.V., Mitchell, T.E. and Heuer, A.H., J. Am. Ceram. Soc. 61, 392, 462 (1978).Google Scholar
4. Krivanek, O.L., Shaw, T.M. and Thomas, G., J. Appl. Phys. 50, 4223 (1979).CrossRefGoogle Scholar
5. Clarke, D.R., Ultramicroscopy 4, 33 (1979).Google Scholar
6. Spaepen, F., Acta Met. 26, 1167 (1978).Google Scholar
7. Jepps, N.W., Stobbs, W.M. and Page, T.F., EMAG 1981 (Institute of Physics, Bristol) (1981).Google Scholar
8. Sawyer, G.R. and Page, T.F., J. Mat. Sci. 13, 885 (1978).Google Scholar
9. Carter, C.B., Kohlstedt, D.L. and Sass, S.L., J. Am. Ceram. Soc. 63, 623 (1980).CrossRefGoogle Scholar
10. Fukushima, K., Kawakatsu, H. and Fukami, A., J. Phys. D. 7, 257 (1974).Google Scholar
11. Peyre, H., Duval, P. and Henry, L., J. Physique 41, 1353 (1980).Google Scholar
12. Goodman, P. and Moodie, A.F., Acta Cryst. A34, 280 (1974).Google Scholar
13. Bursill, L.A. and Wood, G.J., Phil. Mag. 38, 673 (1978).CrossRefGoogle Scholar