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Mercury Detection with Ag Nanoparticles Reduced on Si Thin Films

Published online by Cambridge University Press:  01 February 2011

A. Kaan Kalkan
A. Kaan Kalkan*
Affiliation:
[email protected], Oklahoma State University, School of Mechanical and Aerospace Engineering, 218 Engineering North, Stillwater, OK, 74078, United States
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Abstract

A surface plasmon resonance mercury sensor was demonstrated by electroless reduction of silver nanoparticles on amorphous silicon thin films. Unlike the previous Ag/Au nanoparticle - Hg interaction investigations, which monitored the blue shift of the dipolar plasmon band of well-dispersed nanoparticles, the present work reveals and explores the red shift of the symmetric hybrid plasmon mode of the interacting nanoparticles in response to Hg vapor exposure. Sensitivity to Hg was explored with varying nanoparticle size, which could be controlled by the immersion time associated with the reduction process. The recovery of the hybrid plasmon band after the Hg exposure was also monitored which was observed to be slower than the recovery of the dipolar plasmon band for noninteracting particles.

Keywords

AgHgsensor
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 1010: Symposium V – Functional Materials for Chemical and Biochemical Sensors , 2007 , 1010-V09-06
Copyright
Copyright © Materials Research Society 2007

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References

1. Katsikas, L., Gutiérrez, M., and Henglein, A., J. Phys. Chem. 100, 11203 (1996).Google Scholar
2. Henglein, A. and Giersig, M., J. Phys. Chem. 104, 5056 (2000).Google Scholar
3. Morris, T., Copeland, H., McLinden, E., Wilson, S., and Szulczewski, G., Langmuir 18, 7261 (2002).Google Scholar
4. Morris, T., Kloepper, K., Wilson, S., and Szulczewski, G., J. Colloid and Interface Science 254,49 (2002).Google Scholar
5. Mirsky, V. M., Vasjari, M., Novotny, I., Rehacek, V., Tvarozek, V., and Wolfbeis, O. S., Nanotechnology 13, 175 (2002).Google Scholar
6. Nagahara, L. A., Ohmori, T., Hashimoto, K., and Fujishima, A., J. Vac. Sci. Technol. A 11, 763 (1993).Google Scholar
7. Oskam, G., Long, J. G., Natarajan, A., and Searson, P. C., J. Phys. D: Appl. Phys. 31, 1927 (1998).Google Scholar
8. Kalkan, A. K. and Fonash, S. J., J. Phys. Chem. B 109, 20779 (2005).Google Scholar
9. Nordlander, P., Oubre, C., Prodan, E., Li, K., and Stockman, M. I., Nano Letters 4, 899 (2004).Google Scholar
10. Bajpai, R. P., Kita, H., and Azuma, K., Jpn. J. Appl. Phys. 15, 2083 (1976).Google Scholar
11. Winter, T. G., J. Am. Phys. 71, 783 (2003).Google Scholar