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Melting Behavior in Granular Metal Thin Films

Published online by Cambridge University Press:  28 February 2011

Karl M. Unruh ,
B.M. Patterson  and
S.I. Shah
Karl M. Unruh
Affiliation:
Department of Physics and Astronomy, University of Delaware, Newark
B.M. Patterson
Affiliation:
Department of Physics and Astronomy, University of Delaware, Newark
S.I. Shah
Affiliation:
Central Research and Development, Experimental Station, E.I. du Pont, de Nemours andCo., Wilmington, DE 19880
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Abstract

Granular metal films consisting of small Sn, Bi, and Pb particles, typically from less than 100 Å to several 1000 Å in size and embedded in a SiO2 matrix, have been fabricated over a range of metal compositions by RF sputter deposition. Two different film geometries have been prepared, homogeneous films and multilayer films consisting of alternating layers of granular metal and SiO2. These films have been characterized by x-ray diffraction and transmission electron microscopy and their melting behavior studied by differential scanning calorimetry. As the concentration of the metal component is decreased, the average particle size decreases and the particle size distribution becomes more narrow. When the solid-liquid transition is studied, the melting temperature has been found to be increasingly depressed as the particle size is reduced. In the smallest particles the relative reduction in the melting temperature is greater than 10 percent. No strong evidence for melting point enhancements, due to pressureeffects arising from the different thermal expansions of the metal particles and the SiO2 matrix, has been observed in either the homogeneous or multilayer films.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 195: Symposium S – Physical Phenomena in Granular Materials , 1990 , 567
Copyright
Copyright © Materials Research Society 1990

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References

REFERENCES

1) See e.g. Multicomponent Ultrafine Microstructures, edited by McCandlish, L.E., Polk, D.E., Siegal, R.W., and Kear, B.H. (Mater. Res. Soc. Proc. 132, Pittsburgh. PA 1989).Google Scholar
2) See e.g. MRS Bulletin, XIV (1989) and references therein.Google Scholar
3) Koch, C.C. and Jang, J.S.C., J. Mater. Sci. 4, 557 (1989); J.S.C. Jang and C.C. Koch, J. Mater. Sci. 5, 325 (1990).Google Scholar
4) Abeles, B., Sheng, P., Coutts, M.D., and Arie, Y., Adv. Phys. 24, 407 (1975); B. Abeles, in Applied Solid-State Science, edited by R. Wolfe (Academic Press, New York, 1976), pp. 1-117.Google Scholar
5) See e.g. Buffat, Ph. and Borel, J.P., Phys. Rev. A13, 2287 (1976) and references therein.Google Scholar
6) See e.g. Boyer, L.L., Phase Transitions 5, 1 (1985) and references therein.Google Scholar
7) Petrov, Yu. I. and Kotelnikov, V.A., Phys. Stat. Sol. 34, K123 (1969).Google Scholar
8) Wildner, W., Pfannes, H.-D., and Gonser, U., J. de Phys. 35, C6–381 (1974).Google Scholar
9) Cheyssac, P., Kofman, R., and Carrigos, R., Solid St. Commun. 44, 1583 (1982); R. Garrigos, R. Kofman, P. Cheyssac, and M.Y. Perrin, Europhysics Lett. 1, 355 (1986).Google Scholar
10) Perepezko, J.H. and Anderson, I.E., in Synthesis and Properties of Metastable Phases, edited by Machlin, E.S. and Rowland, T.J. (The Metallurgical Society of AIME, Warrendale, PA, 1980), pp. 31–63; J.H. Perepezko, B.A. Mueller, and K. Ohsaka, in Undercooled Alloy Phases, edited by E.W. Collings and C.C. Koch (Proceedings of the 1986 Hume-Rothery Memorial Symposium, New Orleans, LA, 1986), pp. 289-319.Google Scholar
11) Elderton, W.D. and Johnson, N.L., Systems of Freauency Curves (Cambridge University Press, London, 1969), p. 45.Google Scholar
12) Klug, H.P. and Alexander, L.E., X-Ray Diffraction Procedures (John Wiley & Sons, New York, 1974), p. 661.Google Scholar
13) Reiss, H. and Wilson, I.B., J. Coll. Sci. 3, 551 (1948); C.R.M. Wronski, Brit. J. Appl. Phys. 18, 1731 (1967); C.J. Coombes, J. Phys. F: Metal Phys. 2. 441 (1972).Google Scholar
14) Allen, G.L., Gile, W.W., and Jesser, W.A., Acta Met. 28, 1695 (1980); G.L. Allen, R.A. Bayles, W.W. Gile, and W.A. Jesser, Thin Solid Films 144, 297 (1986).Google Scholar
15) Hasegawa, M., Hoshino, K., and Watabe, M., J. Phys. F: Metal Phys. 10, 619 (1979).Google Scholar