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Mechanism of Defect Reactions in Semiconductors

Published online by Cambridge University Press:  31 January 2011

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Abstract

Proposed mechanisms so far on defect reactions in semiconductors are reexamined. Structural instability of point defects is explained in terms of the Jahn-Teller effect. It is found that the tetrahedral coordinated bonds, which do not have inversion symmetry, are not so rigid as we consider, especially for hole localization. Second topic is the phonon-kick mechanism for defect reactions under carrier injection. In order to discuss this mechanism in detail, we recall the configuration coordinate (c-c) diagram, which is often misunderstood in the literature. The proper relation is explained among the lattice distortion, the position of the electronic level in the band gap (thermal and optical depths), the total energy the multiphonon (e and h) carrier capture processes and the following induced lattice relaxation. A numerical simulation has been performed on phonon kick mechanism. It is found that a rapid increase of the transient lattice vibration around the defect is possible and the probability critically depends on the carrier concentrations and the phonon frequency distribution.

Type
Research Article
Copyright
Copyright © Materials Research Society 2010

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References

1. Ueda, O., “Reliability and degradation of III-V optical devices” (Artech House Publishers, Boston-London) 1996.Google Scholar
2. Maeda, K. and Takeuchi, S., in “Dislocations in Solids”, Vol.10, ed. by Nabarro, F. R. N. and Duesbery, M. S. (North-Holland, Amsterdam, 1996), p. 444504.Google Scholar
3. Shinozuka, Y., “Defects in Optoelectronic Materials” Ed . by Wada, Kazumi and Pang, Stella W. (Gordon and Breach Science Publishers, 2001) Chapter 8.Google Scholar
4. Jahn, H. A. and Teller, E., Proc. Roy. Soc. A161, 220 (1937).Google Scholar
5. Toyozawa, Y., J. Phys. Soc. Jpn. 51, 1861 (1981).10.1143/JPSJ.50.1861Google Scholar
6. El-Maghraby, M. and Shinozuka, Y., J. Phys. Soc. Jpn. 67, 3524 (1998).10.1143/JPSJ.67.3524Google Scholar
7. Takahashi, I. and Shinozuka, Y., Physica b 340–342, 349 (2003).10.1016/j.physb.2003.09.092Google Scholar
8. Bourgoin, J. C. and Corbett, J. M., Phys. Lett. 38A, 135 (1972).10.1016/0375-9601(72)90523-3Google Scholar
9. Bourgoin, J. C. and Corbett, J. M., Radiation Effects 36, 157 (1978).10.1080/00337577808240846Google Scholar
10. Sheinkman, M. K., JETP Lett. 38, 330 (1983)Google Scholar
11. Sheinkman, M. K. and Kimerling, L. C., “Defect Control in Semiconductors”, ed Sumino, K. (North-Holland, 1990) p. 97.Google Scholar
12. Saito, M., Oshiyama, A. and Sugino, O., Phys. Rev. B 47, 13205 (1993).10.1103/PhysRevB.47.13205Google Scholar
13. Toyozawa, Y., Solid State Electron. 21, 1313 (1978).10.1016/0038-1101(78)90199-5Google Scholar
14. Shinozuka, Y., J. Phys. Soc. Jpn. 51, 2852 (1982).10.1143/JPSJ.51.2852Google Scholar
15. Shinozuka, Y., Jpn. J. Appl. Phys. 32, 4560 (1993).10.1143/JJAP.32.4560Google Scholar
16. Shinozuka, Y. and Karatsu, T., Physica B273–274 (1999) 999.10.1016/S0921-4526(99)00616-XGoogle Scholar
17. Shinozuka, Y., Physica B 308–310 (2001) 506.10.1016/S0921-4526(01)00724-4Google Scholar
18. Shinozuka, Y., unpublished.Google Scholar
19. Henry, C. H. and Lang, D. V., Phys. Rev. B15, 989 (1977).10.1103/PhysRevB.15.989Google Scholar
20. Sumi, H., Phys. Rev. B 29, 4616 (1985), J. Phys. C 17, 6071 (1984).Google Scholar
21. Kayanuma, Y., J. Phys. Soc. Jpn. 51 (11) 3526 (1982).10.1143/JPSJ.51.3526Google Scholar
22. Kayanuma, Y. and Fukuchi, S., J. Phys. Soc. Jpn. 53 (5) 1869 (1984).10.1143/JPSJ.53.1869Google Scholar