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Mechanical Reliability of Z5u Multilayer Capacitors*

Published online by Cambridge University Press:  25 February 2011

Kelly D. Mchenry  and
Barry G. Koepke
Kelly D. Mchenry
Affiliation:
Honeywell Ceramics Center, 5121 Winnetka Avenue North, New Hope, MN 55428
Barry G. Koepke
Affiliation:
Honeywell Ceramics Center, 5121 Winnetka Avenue North, New Hope, MN 55428
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Abstract

Dynamic fatigue experiments were performed on Z5U multilayer capacitors in an attempt to correlate microflaw fracture behavior due to intrinsic processing defects within the material with predictions of fracture behavior based on macrocrack fracture mechanics determinations. A direct correlation between microflaw fracture behavior and predictions based upon macrocrack fracture mechanics techniques was not observable due to the wide size range of processing defects. A systematic post-mortem examination of fracture surfaces was used to identify fracture origins and sort individual test specimens into groups with equivalent flaw sizes. The correlation between microflaw and macrocrack fracture behavior became more “sorting” the dynamic fatigue data into groups withm oereq uoibvvailoeunst aflfatwer sizes.

Type
Articles
Information
MRS Online Proceedings Library (OPL) , Volume 72: Symposium G – Electronic Packaging Materials Science II , 1986 , 113
Copyright
Copyright © Materials Research Society 1986

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Footnotes

*

Work sponsored by the Office of Naval Research

References

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