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Measuring Vacancy Diffusivity and Vacancy Assisted Clustering by Nitridation Enhanced Diffusion of Sb IN Si(100) Doping Superlattices

Published online by Cambridge University Press:  21 February 2011

Toshiharu K. Mogi ,
H. -J. Gossmanri ,
C. S. Rafferty ,
H. S. Luftman ,
F. C. Unterwald ,
T. Boone ,
Michael O. Thompson  and
J. M. Poate
Toshiharu K. Mogi
Affiliation:
Department of Materials Science and Engineering, Cornell University, Ithaca, NY 14853
H. -J. Gossmanri
Affiliation:
AT&T Bell Laboratories, Murray Hill, NJ 07974
C. S. Rafferty
Affiliation:
AT&T Bell Laboratories, Murray Hill, NJ 07974
H. S. Luftman
Affiliation:
AT&T Bell Laboratories, Breinigsville, PA 18031
F. C. Unterwald
Affiliation:
AT&T Bell Laboratories, Murray Hill, NJ 07974
T. Boone
Affiliation:
AT&T Bell Laboratories, Murray Hill, NJ 07974
Michael O. Thompson
Affiliation:
Department of Materials Science and Engineering, Cornell University, Ithaca, NY 14853
J. M. Poate
Affiliation:
AT&T Bell Laboratories, Murray Hill, NJ 07974
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Abstract

An investigation of the properties of Si native point defects was undertaken using low temperature annealing of molecular beam epitaxially grown Sb and B doping superlattice structures. The superlattice structures, consisting of 10 nm B or Sb doping spikes separated by 100 nm, were annealed in NH3 at 810°C, 860°C, and 910°C. During thermal nitridation under these annealing conditions, we observed enhanced Sb diffusivity caused by the injection of vacancies, and retarded B diffusivity, resulting from the depletion of interstitials. Since the diffusivities of Sb and B are proportional to the vacancy and interstitial concentrations respectivity, spatially resolved diffusivity measurements permit effective point defect diffusivities to be inferred. From the spatial decay length of the Sb diffusion enhancement, lower limits for the effective vacancy diffusivity were obtained (limited by possible vacancy trapping). Evidence of vacancy assisted Sb clustering during NH3 anneals is also presented.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 355: Symposium B1 – Evolution of Thin-Film and Surface Structure and Morphology , 1994 , 157
Copyright
Copyright © Materials Research Society 1995

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References

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