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Measurement of Stratified Distributions of Dielectric Properties and Dependent Physical Parameters

Published online by Cambridge University Press:  10 February 2011

A. V. Mamishev
Affiliation:
Laboratory for Electromagnetic and Electronic Systems, Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, Cambridge, MA, 02139, [email protected]
Y. Du
Affiliation:
Laboratory for Electromagnetic and Electronic Systems, Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, Cambridge, MA, 02139, [email protected]
B. C. Lesieutre
Affiliation:
Laboratory for Electromagnetic and Electronic Systems, Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, Cambridge, MA, 02139, [email protected]
M. Zahn
Affiliation:
Laboratory for Electromagnetic and Electronic Systems, Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, Cambridge, MA, 02139, [email protected]
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Abstract

Recent advances in ω-k (frequency-wavenumber) interdigital dielectrometry are described. Using this technology, information about the microstructure of dielectric materials is obtained by applying to the sensor-dielectric interface a spatially periodic electric potential swept in frequency from 0.005 Hz to 10,000 Hz. The penetration depth of the electric field is proportional to the spatial wavelength of the electric potential. Application of multi-wavelength electrode arrangements allows measurement of stratified distributions of complex dielectric permittivity. Calibration techniques serve to relate the distributed dielectric properties of materials to other physical variables, such as density, porosity, cracking, lamination, and diffusion of contaminants into the material. The specific problem treated in this paper is in the measurement of moisture concentration distribution in transformer pressboard during the diffusion of water molecules from ambient transformer oil. The output of interdigital sensors is strongly influenced by the microgranularity of the material's surface. Although this dependence complicates interpretation of the measurements in some applications, the variation of the output may also be used to characterize the shape of the surface on the microscale.

Type
Research Article
Copyright
Copyright © Materials Research Society 1998

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References

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