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Measurement of Residual Strains with High Depth Resolution by Energy-Variable Diffraction on Synchrotron Beam Lines

Published online by Cambridge University Press:  01 February 2011

E. Zolotoyabko ,
B. Pokroy  and
J. P. Quintana
E. Zolotoyabko
Affiliation:
Department of Materials Engineering, Technion-Israel Institute of Technology, Haifa 32000, Israel.
B. Pokroy
Affiliation:
Department of Materials Engineering, Technion-Israel Institute of Technology, Haifa 32000, Israel.
J. P. Quintana
Affiliation:
Northwestern University, DND-CAT, APS/ANL Sector 5, Building 432A, 9700 South Cass Avenue, Argonne, IL 60439–4857, U.S.A.
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Abstract

An energy-variable synchrotron diffraction technique is established as a novel method for depth-resolved measurements of d-spacings and residual strains in polycrystalline structures. The depth sensitivity is achieved by the controlled changing the x-ray energy and, hence, the x-ray penetration into the sample. Quasi-parallel synchrotron radiation being diffracted at different depths deviates differently from the detector axis. As a result, the maximum diffraction intensity recorded in the detector is coming from a certain depth, which is energy dependent. This finding opens a way for strain measurements with high depth resolution by changing the x-ray energy in small enough steps. The developed technique is applied to characterize the electrodeposited Cu/Ni multilayers.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 840: Symposium Q – Neutron and X-Ray Scattering as Probes of Multiscale Phenomena , 2004 , Q7.7
Copyright
Copyright © Materials Research Society 2005

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References

REFERENCES

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