Hostname: page-component-78c5997874-94fs2 Total loading time: 0 Render date: 2024-11-09T15:24:34.238Z Has data issue: false hasContentIssue false

A Mass Spectrometric System for the Study of Transient Plasma Species in Thin Film Deposition

Published online by Cambridge University Press:  15 February 2011

N.P. Johnson
Affiliation:
Department of Metallurgy and Materials, University of Strathclyde, Glasgow Gl IXN, Scotland
A.P. Webb
Affiliation:
Department of Electronics and Electrical Engineering, University of Glasgow, Glasgow, Scotland
D.J. Fabian
Affiliation:
Department of Physics, Simon Fraser University, Burnaby, B.C. Canada, On leave from University of Strathclyde, Glasgow, Scotland
Get access

Abstract

A system is described for mass spectrometric detection of transient gaseous species involved in reactive plasma deposition of materials. The equipment comprises a three stage differentially pumped UHV quadrupole mass spectrometer chamber, which permits modulated molecular beam sampling over a short path-length, direct from the plasma at 0.1–1.0 torr pressure. Operation of the system and optimum conditions for maximum signal-detection are detailed, and preliminary results for species formed in a silane-argon high-power rf discharge are reported. Spectra mostly agree with those obtained by Turban and Catherine using a lower power rf plasma, although some evidence is observed for the formation of increased SiH species at higher power.

Type
Research Article
Copyright
Copyright © Materials Research Society 1984

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Joyce, R.J., Sterling, H.F. and Alexander, J.H., Thin Solid Films 1, (1967)/68 481.Google Scholar
2. Ovshinsky, S.R., Proc.Int'l. Ion Engineering Congress ISIAT-IPAT '83, (Kyoto, Japan 1983 Ed.Tagaki, T., Vol.II, 817.Google Scholar
3. Heinecke, R.A.H., Sol.St. Elect. 18, (1975) 1146.Google Scholar
4. Coburn, J.W. and Kay, E., Proc. 7th Int.Vac.Congr. and 3rd Int.Conf. Solid Surfaces (Vienna, 1977 1257.Google Scholar
5. Flamm, D.L., Donnelly, V.W. and Mucha, J.A., J.Appl.Phys. 52, (1981) 3633.Google Scholar
6. Flamm, D.L., Donnelly, V.W. and Ibbotson, D., J.Vac.Sci.Tech. B1,(1983) 23.Google Scholar
7. Turban, G., Catherine, Y. and Grolleau, B., Thin Solid Films 77 (1981) 287.Google Scholar
8. Wagner, J. and Veprek, S., Plasma Chem. and Plasma Proc. 2, (1981) 95.Google Scholar
9. Veprek, S., Pure amd Appl.Chem. 48, (1976) 1631;Google Scholar
9a and Appl.Phys. 7,(1975) 271.Google Scholar
10. Veprek, S., Iqbal, Z., Oswald, H.R. and Webb, A.P., J.Phys.C.Sol.St.Phys. 14, (1981) 295.Google Scholar
11. Holland, L., Vacuum 3 (1953) 330.Google Scholar
12. Avaritsiotis, J.N. and Howson, R.P., Thin Solid Films 65, (1980) 101.Google Scholar
13. Avaritsiotis, J.N., Howson, R.P., Ridge, M.I. and Bishop, C.A., Trans.Inst. Met.Finish (G.B.), 57, (1979) 65.Google Scholar
14. Webb, A.P. and Fabian, D.J. in Proc. 2nd European Conf. on Sol.St.Chem. (Netherlands, 1982); Elsevier Sci.Publ.Co. “Solid State Chemistry 1982”;Google Scholar
14a Studies in Inorg.Chem. 3, (1983) 427.Google Scholar
15. Webb, A.P. and Fabian, D.J., Proc. of the Int.Conf. on Ion Assisted Surface Treatments Techniques and Applications (Warwick, 1982 20.1 (Publ. by Metals Soc.).Google Scholar
16. Veprek, S., Topics in Current Chem. 56, (1975) 139.Google Scholar
17. See for example Proc. 6th Int'l. Symp.Plasma Chemistry (ISPC6), Montreal 1983 (also ISPCS, Edinburgh 1981 and ISPC4, Zurich 1979).Google Scholar
18. Sokolowski, M.,et al Thin Sol.Films 80, (1980) 249.Google Scholar
19. See for example: Fabian, D.J. and Bryce, W.A., in 7th Int'l. Symp. on Combustion, Butterworths (London, 1958) 150.Google Scholar
20. Foner, S.N. and Hudson, R.L., J.Chem.Phys. 21, (1953) 1374.Google Scholar
21. Smolinsky, G. and Vasile, M.J., Int'l. J.Mass Spectry. Ion Phys. 16, (1975) 137.Google Scholar
22. Fite, W.L., Int'l. J. Mass Spec. Ion Phys. 16, (1975) 109.Google Scholar
23. Kaufman, M., Pure and Appl. Chem. 48, (1976) 155.Google Scholar
24. Wagner, J.J. and Brandt, W.W., Plasma Chem. Proc. 1, (1981) 1.Google Scholar
25. Turban, G., Catherine, Y. and Grollau, B., Thin Sol. Films 67, (1980) 309 Google Scholar
26. Catherine, Y. and Turban, G., Thin Sol. Filma 60, (1979) 193.Google Scholar
27. Turban, G., Catherine, Y. and Grolleau, B., Thin Sol. Films 60 (1979) 158.Google Scholar
28. Francis, G., Ionization Phenomena in Gases, Butterworths, London, 1960.Google Scholar