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Mask Technology For X-Ray Nanolithography

Published online by Cambridge University Press:  15 February 2011

M. L. Schattenburg
Affiliation:
Massachusetts Institute of Technology, 77 Massachusetts Avenue, Cambridge, MA 02139.
J. Carter
Affiliation:
Massachusetts Institute of Technology, 77 Massachusetts Avenue, Cambridge, MA 02139.
W. Chu
Affiliation:
Massachusetts Institute of Technology, 77 Massachusetts Avenue, Cambridge, MA 02139.
R. C. Fleming
Affiliation:
Massachusetts Institute of Technology, 77 Massachusetts Avenue, Cambridge, MA 02139.
R. A. Ghanbari
Affiliation:
Massachusetts Institute of Technology, 77 Massachusetts Avenue, Cambridge, MA 02139.
M. Mondol
Affiliation:
Massachusetts Institute of Technology, 77 Massachusetts Avenue, Cambridge, MA 02139.
N. Polce
Affiliation:
Massachusetts Institute of Technology, 77 Massachusetts Avenue, Cambridge, MA 02139.
Henry I. Smith
Affiliation:
Massachusetts Institute of Technology, 77 Massachusetts Avenue, Cambridge, MA 02139.
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Abstract

In this report we describe a system of technologies we have developed for fabricating, patterning, and replicating x-ray masks with linewidths as fine as 50 nm (0.05 μm). This effort has evolved into a fairly routine service supporting a growing community of researchers at MIT interested in fabricating sub-micron and nanometer scale structures and devices. Strong, transparent, silicon-rich nitride (SiN) membranes bonded to optically-flat Pyrex rings and patterned with gold absorbers form the basic x-ray mask structure. We have recently completed the installation of a vertical thermal reactor (VTR) for the deposition of SiN coatings. Results indicate superb film uniformity, decreased defect counts, and increased strength over previously available nitrides. Patterning of the masks is performed at an off-site location by electron-beam lithography followed by development and gold electroplating at MIT. We describe a new fountain plating bath and mask chuck which allows us to obtain clean, uniform gold films of low stress. Once completed, the so-called “master” masks are replicated onto new x-ray mask substrates which are then processed into “daughter” masks. The resulting polarity-reversed patterns are required in order to achieve the desired pattern in positive resist when printed onto substrates. We will describe our in-house built x-ray aligner which features a high-power electron bombardment source and SiN vacuum isolation window to achieve exposures in a helium environment.

Type
Research Article
Copyright
Copyright © Materials Research Society 1993

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References

1. Smith, H. I. and Schattenburg, M. L., IBM I. of Res. and Dev. (in press).Google Scholar
2. Moel, A., et al., J. Vac. Sci. Technol. B 9, 32873291 (1991).Google Scholar
3. Chu, W., et al., I. Vac. Sci. Technol. B 10, 118121 (1991).Google Scholar
4. Chu, W., Schattenburg, M. L., and Smith, H. I., Microelectronic Engin. 17, 223226 (1992).Google Scholar
5. Enthone OMI, Inc., 350 Frontage Rd., West Haven, CT 06516.Google Scholar
6. Moel, A., Schattenburg, M. L., Carter, J. M., and Smith, H. I., J. Vac. Sci. Technol. B 8, 16481651 (1991).Google Scholar
7. Ghanbari, R. A., et al., J. Vac. Sci. Technol. B 10, 31963199 (1991).CrossRefGoogle Scholar
8. Moel, A., Ph. D. thesis, MIT, Oct. 1992; A. Moel, E. E. Moon, R. Frankel, J. Munroe, and H. L. Smith, J. Vac. Sci. Technol. B (to be published).Google Scholar