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Magnetometry in Ultrathin Films using Spin Polarized Cascade Electrons

Published online by Cambridge University Press:  03 September 2012

Eric Kay
Eric Kay*
Affiliation:
IBM Research Division, Almaden Research Center, 650 Harry Road, San Jose, CA 95120-6099
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Abstract

In this review, we show how spin polarized cascade electron spectroscopy provides a relatively rapid and flexible approach to the study of a variety of problems of current interest in both ultrathin magnetic films and surface magnetism. Specific examples relating to the non-bulk like magnetization behavior as a function of temperature of ultrathin films are given which lead to the conclusion that stabilization of the magnetization at low temperature is a universal characteristic of ultrathin magnetic films. Comparison between ultrathin film and surface magnetic behavior is made. Evidence is given that the weakening of exchange coupling both at the surface of a bulk sample and across magnetic spacer layers between an ultrathin magnetic thin film and a bulk sample can be evaluated and dramatic effects due to minute quantities of non-magnetic nearest neighbors are demonstrated.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 151: Symposium G – Growth, Characterization and Properties of Ultrathin Magnetic Films and Multilayers , 1989 , 77
Copyright
Copyright © Materials Research Society 1989

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References

REFERENCES

1. Koike, K., Matsuyama, H. and Hayakama, K. Scanning Microscopy Supplement 1, 241 (1987).Google Scholar
2. Pierce, D. T., Unguris, J. and Celotta, R. I. MRS Bull. XII 6, 19 (1988).Google Scholar
3. Oepen, H. P. and Kirschner, J. ICM Paris SA-1 (1988).Google Scholar
4. Landolt, M. and Mauri, D. Phys. Rev. Lett. 49, 1783 (1982); M. Landolt, R. Allenspach and M. Taborelli Surface Science 178, 311 (1986).Google Scholar
5. Aeschlimann, M., Stampanoni, M., Vaterlaus, A. and Meier, F. ICM Paris 4D-7 (1988).Google Scholar
6. Eib, W. and Alvarado, S. F. Phys. Rev. Lett. 37, 444 (1976).CrossRefGoogle Scholar
7. Kisker, E., Schroeder, K., Gudat, W. and Campagna, M. Plys. Rev. B. 31, 329 (1985).Google Scholar
8. Donath, M., Dose, V., Ertl, K., Kolvac, U., Liebl, H. and Schonhense, G. ICM Paris IA-4 (1988).Google Scholar
9. Dodt, Th., Tillmann, D., Rochow, R. and Kisker, E. Europhys Lett. 6, 375 (1988).Google Scholar
10. Gay, T. G. and Richter, R. Phys. Rev. Lett. 56, 2728 (1986).Google Scholar
11. Mathon, T. and Ahmad, S. B. Phys. Rev. B. 37, 660 (1988).Google Scholar
12. Mathon, T. Physica B. 149, 31 (1988).CrossRefGoogle Scholar
13. Durr, W., Taborelli, M., Paul, O., Germar, R., Gudat, W., Pescia, D. and Landolt, M. Phys. Rev. Left. 62, 206 (1989).CrossRefGoogle Scholar
14. Mauri, D., Allenspach, R. and Landolt, M. J. Appl. Phys. 58, 906 (1985).Google Scholar
15. Mauri, D., Scholl, D., Siegmann, H. C. and Kay, E. Phys. Rev. Lett. April 19, 1989.Google Scholar
16. Bayreuther, G. Magn. Mater. 38, 273 (1983).Google Scholar
17. Stampanoni, M., Vaterlaus, A., Aeschlimann, M. and Meier, F. Phys. Rev. Lett. 59, 2483 (1987); R. F. Willis, T. A. C. Bland and W. Schwarzacher. J Appl. Phys. 63, 4051 (1988).Google Scholar
18. Przybylski, M. and Gradmann, U. Phys. Rev. Lett. 59, 1152 (1987).CrossRefGoogle Scholar
19. Pescia, D., Zampieri, G., Stampanoni, M., Bona, G. L., Willis, R. F. and Meier, F. Phys. Rev. Lett. 58, 933 (1987).Google Scholar
20. Dbring, W. Z. Naturforsch. 16a, 1146 (1961).CrossRefGoogle Scholar
21. Brundle, C. R., Silverman, E. and Madix, R. J. J. Vac. Sci. Tech. 16, 474 (1979).Google Scholar
22. Mauri, D., Scholl, D., Siegmann, H. C. and Kay, E., “Applied Physics A – Solids and Surfaces in Print” (1989).Google Scholar
23. Abraham, D. L. and Hopster, H. Phys. Rev. Lett. 58, 132 (1987).Google Scholar
24. Gradmann, U., Bergholz, R. and Bergter, E. Thin Solid Films 126, 107 (1985).Google Scholar
25. Robl, W. and Bayreuther, G. “12th Intl. Colloq. on Magnetic Films and Surfaces,” Le Creusot, France, Aug. 1–5, 1988.Google Scholar
26. Pierce, D. T., Cellotta, R. J., Unguris, J. and Siegmann, H. C. Phys. Rev. B. B 26, 2566 (1982).Google Scholar
27. Walker, J. C., Droste, R., Stern, G. and Tyson, J. J. Appl. Phys. 55, 2500 (1984).Google Scholar
28. Korecki, J. and Gradmann, U. Phys. Rev. Lett. 55, 2491 (1985).Google Scholar
29. Mauri, D., Scholl, D., Siegmann, H. C. and Kay, E. Phys. Rev. Lett. 61:6, 758 (1988).Google Scholar