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Magnetic Losses in Thick Barium-Hexaferrite Films on MgO (111)

Published online by Cambridge University Press:  18 March 2011

S.D. Yoon ,
S.A. Oliver ,
P. Shi ,
X. Zuo  and
C. Vittoria
S.D. Yoon
Affiliation:
Department of Electrical and Computer Engineering, Northeastern University, Boston MA
S.A. Oliver
Affiliation:
Center for Subsurface and Sensing and Imaging Systems, Northeastern University, Boston MA
P. Shi
Affiliation:
Department of Electrical and Computer Engineering, Northeastern University, Boston MA P. Shi is now with Philips Research Ins., Richardson TX
X. Zuo
Affiliation:
Department of Electrical and Computer Engineering, Northeastern University, Boston MA
C. Vittoria
Affiliation:
Department of Electrical and Computer Engineering, Northeastern University, Boston MA
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Abstract

Barium hexaferrite films having thickness from 3 to 30 μm were deposited onto 0.5 mm Magnesium Oxide (111) substrates, and were examined by vibrating sample magnetometry, torque magnetometry, x-ray diffraction, and scanning electron microscope measurements. Ferrimagnetic resonance measurements were taken with the magnetic field applied perpendicular to the film plane. The FMR linewidth values for as-produced 3 - 30 μm films was 0.45 - 0.70 kOe, and was reduced to 0.06 - 0.45 kOe after annealing at 1000 °C for 2 hours. Further annealing increased the linewidth. The FMR linewidth for the 30 μm thick film was also found to decrease upon mechanically removing 55 ∼ 77 % of the substrate thickness. A 6-fold in-plane anistropy symmetry in the anisotropy energy was observed in torque magnetometry measurements for films thicker than 30 μm. These results can be interpreted as due to film inhomogeneity, stress, and the growth of small regions of non c-axis textured material.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 656: Symposium DD – Materials Issues for Tunable RF and Microwave Devices II , 2000 , DD4.10
Copyright
Copyright © Materials Research Society 2001

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References

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