Hostname: page-component-78c5997874-t5tsf Total loading time: 0 Render date: 2024-11-20T04:11:34.420Z Has data issue: false hasContentIssue false
  • English
  • Français

Magnetic Anisotropy of Strained La0.7Sr0.3MnO3 Thin Films Studied by MOKE

Published online by Cambridge University Press:  17 March 2011

M. Koubaa ,
A.M. Haghiri-Gosnet ,
P. Lecoeur ,
W. Prellier  and
B. Mercey
M. Koubaa
Affiliation:
Institut d'Electronique Fondamentale - IEF, Univ. Paris Sud, Bat 220, 91405 Orsay Cedex, France
A.M. Haghiri-Gosnet
Affiliation:
Institut d'Electronique Fondamentale - IEF, Univ. Paris Sud, Bat 220, 91405 Orsay Cedex, France
P. Lecoeur
Affiliation:
Laboratoire de Cristallographie et de Sciences des Matériaux, CRISMAT- ISMRA, CNRS UMR 6508, 6 bd du Maréchal Juin, 14050 Caen Cedex, France
W. Prellier
Affiliation:
Laboratoire de Cristallographie et de Sciences des Matériaux, CRISMAT- ISMRA, CNRS UMR 6508, 6 bd du Maréchal Juin, 14050 Caen Cedex, France
B. Mercey
Affiliation:
Laboratoire de Cristallographie et de Sciences des Matériaux, CRISMAT- ISMRA, CNRS UMR 6508, 6 bd du Maréchal Juin, 14050 Caen Cedex, France
Get access

Abstract

The effects of the growth conditions and the lattice strains of pulsed laser deposited (PLD) La0.7Sr0.3MnO3 (LSMO) thin films upon the magnetic behavior have been studied using magneto-optical Kerr effect (MOKE) at room temperature. First, the structural quality of the films was investigated by XRD and the surface morphology was studied using AFM. It is shown that both surface morphology and crystallinity are optimized when the target-to-substrate distance and the oxygen pressure are chosen in agreement with a PD3 scaling law. Secondly, hysteresis loops have been recorded along the [100], [110] and [001] directions and the easy directions of magnetization have been determined for both stress states, i.e. tension on SrTiO3 and compression on LaAlO3. In tensile films, the whole plane is found to be easy, whereas, in compressive films, the easy axis should be an intermediate direction between the film's plane and its normal. Moreover, tensile films deposited under optimized growth conditions exhibit the largest anisotropy coefficient (K1eff = -6.9×105 erg/cm3).

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 690: Symposium F – Spintronics , 2001 , F9.9
Copyright
Copyright © Materials Research Society 2002

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Venkatesan, T., Rajeswari, M., Dong, Z., Ogale, S. B. and Ramesh, R., Phil. Trans. R. Soc. Lond. A 356, 1661–1680(1998).Google Scholar
2. Wolfman, J., Haghiri-Gosnet, A. M., Raveau, B., Vieu, C., Cambril, E., Cornette, A. and Launois, H., J. Appl. Phys. 89, 6955 (2001).Google Scholar
3. Suzuki, Y., Hwang, H. Y., Cheong, S-W., Siegrist, T., Dover, R. B. van, Asamitsu, A. and Tokura, Y., J. Appl. Phys. 83, 7064 (1998).Google Scholar
4. Suzuki, Y., Hwang, H. Y., Cheong, S-W. and Dover, R. B. van, Appl. Phys. Lett. 71, 140 (1997).Google Scholar
5. Haghiri-Gosnet, A. M., Koubaa, M., Desfeux, R., Lecoeur, P., Prellier, W. and Mercey, B., submitted to Thin Solid Films.Google Scholar
6. Haghiri-Gosnet, A. M., Hervieu, M., Simon, Ch., Mercey, B. and Raveau, B., J. Appl. Phys. 88 (2000) 3545.Google Scholar
7. Kim, H.S. and Kwok, H.S., Appl. Phys. Lett. 61, 2234 (1992).Google Scholar
8. Lebedev, O. I., Tendeloo, G. Van, Amelinckx, S., Ju, H. L., , Kannan and Krishnan, M., Philosophical Magasine 80, 673 (2000).Google Scholar
9. Ferré, J., Pénissard, G., Marlière, C., Renard, D., Beauvillain, P. and Renard, J. P., Appl. Phys. Lett. 56, 1588 (1990).Google Scholar
10. O'Donnell, J., Rzchowski, M. S., Eckstein, J. N. and Bosovic, I., Appl. Phys. Lett. 72, 1775 (1998).Google Scholar
11. Kwon, C., Robson, M. C., Kim, K.-C., Gu, J. Y., Lofland, S. E., Bhagat, S. M., Trajanovic, Z., Rajeswari, M., Venkatesan, T., Kratz, A. R., Gomez, R. D. and Ramesh, R., J. Magn. Magn. Matter. 172, 229 (1997).Google Scholar
12. Tsui, F., Smoak, M. C., T. Nath, K. and Eom, C. B., Appl. Phys. Lett. 76, 2421 (2000).Google Scholar
13. Cagnon, L., Devolder, T., Cortes, R., Morrone, A., Schmidt, J. E., Chappert, C. and Allongue, P., Phys. Rev. B 63, 104419 (2001).Google Scholar
14. Berndt, L. M., Balbarin, Vincent and Suzuki, Y., Appl. Phys. Lett. 77, 2903 (2000).Google Scholar
15. Nath, T. K., Rao, R. A., Lavric, D., Eom, C. B., Wu, L. and Tsui, F., Appl. Phys. Lett. 74, 1645 (1999).Google Scholar
16. Steren, L. B., Sirena, M. and Guimpel, J., J. Appl. Phys. 87, 6755 (2000).Google Scholar