Hostname: page-component-cd9895bd7-q99xh Total loading time: 0 Render date: 2024-12-27T02:04:05.027Z Has data issue: false hasContentIssue false

Magnetic and Magneto-Optical Properties of Exchange Coupled Films of Transition Metals/TbFeCo

Published online by Cambridge University Press:  21 February 2011

Hidehiko Wakabayashi
Affiliation:
IBM Research Division, Almaden Research Center, 650 Harry Road, San Jose, California 95120-6099
Harris Notarys
Affiliation:
IBM Research Division, Almaden Research Center, 650 Harry Road, San Jose, California 95120-6099
James C. Suits
Affiliation:
IBM Research Division, Almaden Research Center, 650 Harry Road, San Jose, California 95120-6099
Takao Suzuki
Affiliation:
IBM Research Division, Almaden Research Center, 650 Harry Road, San Jose, California 95120-6099
Get access

Abstract

Magnetic and magneto-optical properties of transition metal films (Co, Ni) deposited on TbFeCo films were studied for application to magneto-optical recording. Individual films of Co or Ni showed in-plane remanent magnetization, although for Co a component of perpendicular anisotropy was found to increase for thinner films. Double layer films of Co on TbFeCo showed perpendicular remanent magnetization for Co thicknesses up to 25 Å. The effective exchange field acting on the Co layer was estimated from Kerr loops and was found to increase for thinner Co films. Double layer films of Ni on TbFeCo showed perpendicular remanent magnetization for Ni thicknesses up to 50 Å. Because of the high intrinsic magneto-optical activity of Co, the remanent Kerr rotation of Co on TbFeCo was found to be 50 % larger than for a single layer of TbFeCo with the same total thickness. No Kerr enhancement was found for Ni on TbFeCo.

Type
Research Article
Copyright
Copyright © Materials Research Society 1989

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Weller, D. and Reim, W., Siemens Forsh.-u. Entwickl.-Ber. Bd. 17, 112 (1988).Google Scholar
2. Kobayashi, T., Tsuji, H., Tsunashima, S. and Uchiyama, S., Jpn. J. Appl. Phys. 20, 2089 (1981).Google Scholar
3. Tsunashima, S., Suji, H., Kobayashi, T. and Uchiyama, S., IEEE Trans. Magn. MAG–17, 2840 (1981).Google Scholar
4. Kanaizuka, T. and Suzuki, T., Proc. Int. Conf. Magneto-Optics, 333 (1987)Google Scholar
5. Koyama, M., Ohyama, R., Koyanagi, T., Watanabe, Y. and Matsubara, K. J. Magn. Soc. Jpn. 11, 173 (1987).Google Scholar
6. Katayama, T. and Htasegawa, K., Proc. 4th Int. Conf. Rapidly Quenched Metals, 915 (1981).Google Scholar
7. Gradmann, U. and Muller, J., Czech. J. Phys. B21, 553 (1971).Google Scholar
8. Carcia, P. F., J. Appl. Phys. 63, 5066 (1988).Google Scholar
9. Broeder, F. J. A. den, Kuiper, D., Mosselaer, A. P. van de and Iloving, W., Phys. Rev. Lett. 60, 2769 (1988).Google Scholar
10. Néel, L., J. Phys. Radium 15, 225 (1954).Google Scholar
11. Sato, N. J. Appl. Phys. 64, 6424 (1988).Google Scholar
12. Mansuripur, M. and Ruane, M. F., IEEE Trans. Mag. MAG–22, 33 (1986).Google Scholar
13. Lutes, O. S., ltolmen, J. O., Kooyer, R. L. and Aadland, O. S., IEEE Trans. Mag. MAG–13, 1615 (1977)Google Scholar