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The Luminescent Properties of Ion-Implantation-Fabricated SiO2:nc-Si Nanostructures Annealed at High Temperatures
Published online by Cambridge University Press: 15 February 2011
Abstract
The influence of the Si+ implantation dose and postimplantation annealing temperature on the photoluminescence (PL) intensity of silicon nanoinclusions in an SiO2 matrix was experimentally investigated. The way that the PL varied with dose and annealing temperature was explained on the basis of a model which takes into account the Ostwald ripening of nanocrystals and effect of the quantum dot size on the rate of radiative recombination.
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- Copyright © Materials Research Society 2003
References
1.
Shimizu-Iwayama, T., Kurumado, N., Hole, D.E., Townsend, P.D., J. Appl. Phys. 83, 6018 (1998)Google Scholar
2.
Fernandez, B. Garrido, Lopez, M., Garcia, C., Perez-Rodriguez, A., Morante, J. R., Bonafos, C., Carrada, M., and Claverie, A., J. Appl. Phys. 91, 798 (2002)Google Scholar
3.
Tetelbaum, D.I., Gorshkov, O.N., Trushin, S.A., Revin, D.G., Gaponova, D.M., Eckstein, W., Nanotechnology
11, 295 (2000)Google Scholar
4.
Tetelbaum, D.I., Burdov, V.A., Trushin, S.A., Mikhaylov, A.N., Revin, D.G., Gaponova, D.M., Proceedings of 2001 MRS Fall Meeting
692 (2001).Google Scholar
5.
Trushin, S.A., Mikhailov, A.N., Tetelbaum, D.I., Gorshkov, O.N., Revin, D.G., Gaponova, D.M., Surf. Coat. Tech. 158-159, 717 (2002)Google Scholar
7.
Bonafos, C., Colombeau, B., Altibelli, A., Carrada, M., Assayag, G. Ben, Garrido, B.,Lopez, M., Perez-Rodriguez, A., Morante, J. R., Claverie, A., Nucl. Instrum. Meth. B178, 17 (2001)Google Scholar
9.
Anselm, A.I., Introduction to Semiconductor Theory, Prentice-Hall, Englewood Cliffs (1981).Google Scholar
13.
Tetelbaum, D.I., Trushin, S.A., Mikhaylov, A.N., Vasil'ev, V.K., Kachurin, G.A., Yanovskaya, S.G., Gaponova, D.M., Physica E
16, 410 (2003)Google Scholar
14.
Kachurin, G. A., Yanovskaya, S. G., Ruault, M.-O., Gutakovski, A. K., Zhuravlev, K. S., Kaitasov, O., Bernas, H., Semiconductors
34, 965 (2000)Google Scholar
15.
Tetelbaum, D.I., Trushin, S.A., Burdov, V.A., Golovanov, A.I., Revin, D.G., Gaponova, D.M., Nucl. Instrum. Meth. B174, 123 (2001)Google Scholar