Crossref Citations
This article has been cited by the following publications. This list is generated based on data provided by
Crossref.
Fleischer, D.L.
and
Hatalis, M.K.
1995.
Analysis of scanners for TFT-LCD.
p.
76.
Morita, T.
Yamamoto, Y.
Itoh, M.
Yoneda, H.
Yamane, Y.
Tsuchimoto, S.
Funada, F.
and
Awane, K.
1995.
VGA driving with low temperature processed poly Si TFTs.
p.
841.
Bo, Xiang-Zheng
Yao, Nan
and
Sturm, J. C.
2002.
Large-Grain Polysilicon Films with Low Intragranular Defect Density by Low-Temperature Solid-Phase Crystallization.
MRS Proceedings,
Vol. 715,
Issue. ,
Bo, Xiang-Zheng
Yao, Nan
Shieh, Sean R.
Duffy, Thomas S.
and
Sturm, J. C.
2002.
Large-grain polycrystalline silicon films with low intragranular defect density by low-temperature solid-phase crystallization without underlying oxide.
Journal of Applied Physics,
Vol. 91,
Issue. 5,
p.
2910.
Bo, Xiang-Zheng
Yao, Nan
Wagner, Sigurd
and
Sturm, J. C.
2002.
Spatially selective single-grain silicon films induced by hydrogen plasma seeding.
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena,
Vol. 20,
Issue. 3,
p.
818.
Goswami, Romyani
Chowdhury, Biswajit
and
Ray, Swati
2008.
Solid phase crystallization of protocrystalline silicon films: Changes in structural and optical properties.
Thin Solid Films,
Vol. 516,
Issue. 8,
p.
2306.
Aberle, Armin G.
and
Widenborg, Per I.
2010.
Handbook of Photovoltaic Science and Engineering.
p.
452.
Goswami, Romyani
and
Ray, Swati
2013.
Structural studies on Si:H network before and after solid phase crystallization using spectroscopic ellipsometry: Correlation with Raman spectroscopy and transmission electron microscopy.
Applied Surface Science,
Vol. 282,
Issue. ,
p.
615.