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Localized States and Porous Silicon Luminescence

Published online by Cambridge University Press:  28 February 2011

V. M. Dubin
Affiliation:
Laboratoire de Physique de la Matière Condensée, CNRS-École Polytechnique, 91128 Palaiseau Cèdex, France
F. Ozanam
Affiliation:
Laboratoire de Physique de la Matière Condensée, CNRS-École Polytechnique, 91128 Palaiseau Cèdex, France
J.-N. Chazalviel
Affiliation:
Laboratoire de Physique de la Matière Condensée, CNRS-École Polytechnique, 91128 Palaiseau Cèdex, France
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Abstract

Electronic states of photocarriers in porous silicon have been investigated by photomodulated infrared and photoluminescence spectroscopies. Wet porous silicon is only weakly yellow-green luminescent, and contains photocarriers which exhibit a Drude-like absorption characteristic of free carriers. On the contrary, once dried or anodically oxidized, porous silicon becomes strongly red luminescent and photocarriers exhibit a broad Gaussian-like absorption, characteristic of localized carriers, which correlates in frequency, response time and intensity with the photoluminescence. This behavior does not appear to be related to surface chemistry. Instead, non-wetting of the surface seems to be mandatory in order to obtain localization of the photocarriers and strong red luminescence. This suggests that the driving effect for switching from green to red luminescence could be the dielectric screening of the Coulombic interactions by the embedding medium in which porous silicon is maintained. The electronic states bound to the potential generated by a charge in a cylindrical silicon wire have then been computed for various values of the dielectric constant of the embedding medium. It is shown that, when the dielectric constant is low, one may account for the red luminescence in terms of recombination through such shallow states, and that the finite time needed for the dielectric relaxation in electrolytes may also account for an inefficient trapping in such states in a wet environment. Preliminary luminescence results are consistent with the predictions of the model.

Type
Research Article
Copyright
Copyright © Materials Research Society 1995

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References

REFERENCES

1 Cullis, A.G. and Canham, L.T., Nature (London) 353, 335 (1991).Google Scholar
2 Vial, J.C., Bsiesy, A., Gaspard, F., Hérino, R., Ligeon, M., Muller, F., Romestain, R., Macfarlane, R.M., Phys. Rev. B45, 14171 (1992).Google Scholar
3 Brandt, M.S., Fuchs, H.D., Stutzmann, M., Weber, J., and Cardona, M., Solid State Commun. 81, 307 (1992).Google Scholar
4 Prokes, S.M., Glembocki, O.J., Bermudez, V.M., and Kaplan, R., Phys.Rev. B45, 13788 (1992).Google Scholar
5 Koch, F., Petrova-Koch, V., Muschik, T., Nikolov, A., and Gavrilenko, V. in Microcrystalline Semiconductors: Materials Science and Devices, edited by Fauchet, P.M., Tsai, C.C., Canham, L.T., Shimizu, I., and Aoyagi, A. (Mater. Res.Soc.Proc. 283, Pittsburgh, PA, 1993)p. 197.Google Scholar
6 Tessler, L.R., Alvarez, F., and Teschke, O., Appl. Phys. Lett. 62, 2381 (1993).Google Scholar
7 Zhong, J.X. and Mosseri, R., J. Non Cryst. Solids 164–166, 969 (1993).Google Scholar
8 Sapoval, B. and Russ, S., 1994 MRS Fall Meeting, Boston, MA, 1994 (to be published).Google Scholar
9 Pavesi, L. and Ceschini, M., Phys Rev. B48, 17625 (1993).Google Scholar
10 Dubin, V.M., Ozanam, F., and Chazalviel, J.-N., in Optical Properties of Low Dimensional Silicon Structures, edited by Bensahel, D.C., Canham, L.T., and Ossicini, S. (vol. 244 of NATO Advanced Study Institute, Kluwer Academic, Dordrecht, 1993), pp. 163168.Google Scholar
11 Dubin, V.M., Ozanam, F., and Chazalviel, J.-N., Phys. Rev. B (in press).Google Scholar
12 Dubin, V.M., Ozanam, F., and Chazalviel, J.-N., Thin Solid Films (in press).Google Scholar
13 Robinson, M.B., Dillon, A.C., and George, S.M., Appl. Phys. Lett. 62, 1493 (1992).Google Scholar
14 Mauckner, G., Thonke, K., and Sauer, R., J. Phys. Condens. Matter 5, L9 (1993).Google Scholar
15 Venkateswara Rao, A., Ozanam, F., and Chazalviel, J.-N., J. Electrochem. Soc. 138, 153 (1991).Google Scholar
16 Chazalviel, J.-N., Ozanam, F., and Dubin, V.M., J. Phys. I (France) 4, 1325 (1994).Google Scholar