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Localized Ferromagnetic Resonance Force Microscopy of a Continuous Permalloy-Cobalt Film

Published online by Cambridge University Press:  01 February 2011

Evgueni Nazaretski ,
Denis V. Pelekhov ,
Ivar Martin ,
Kitty C. Cha ,
Elshan A. Akhadov ,
P. Chris Hammel  and
Roman Movshovich
Evgueni Nazaretski
Affiliation:
[email protected], Los Alamos National Laboratory, MPA, MPA-10, MS K764, Los Alamos, NM, 87545, United States, 5056656550
Denis V. Pelekhov
Affiliation:
[email protected], Ohio State University, Columbus, OH, 43210, United States
Ivar Martin
Affiliation:
[email protected], Los Alamos National Laboratory, Los Alamos, NM, 87545, United States
Kitty C. Cha
Affiliation:
[email protected], Los Alamos National Laboratory, Los Alamos, NM, 87545, United States
Elshan A. Akhadov
Affiliation:
[email protected], Los Alamos National Laboratory, Los Alamos, NM, 87545, United States
P. Chris Hammel
Affiliation:
[email protected], Ohio State University, Columbus, OH, 43210, United States
Roman Movshovich
Affiliation:
[email protected], Los Alamos National Laboratory, Los Alamos, NM, 87545, United States
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Abstract

We report on the Magnetic Resonance Force Microscopy (MRFM) experiments performed on a 50 nm thick permalloy and a combined 20 nm thick permalloy – cobalt film. We studied the evolution of the MRFM spectra as a function of the vertical probe-sample distance and the lateral position as probe was scanned across the permalloy/cobalt interface. Our numerical simulations of the ferromagnetic resonance (FMR) modes excited in the presence of a non-uniform tip field of the cantilever compare well with experimental findings. This work demonstrates the capability of MRFM to perform local FMR spectroscopy of different materials in continuous ferromagnetic films.

Keywords

scanning probe microscopy (SPM)magnetic propertiesnanoscale
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 1025: Symposium B – Nanoscale Phenomena in Functional Materials by Scanning Probe Microscopy , 2007 , 1025-B11-18
Copyright
Copyright © Materials Research Society 2008

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