Hostname: page-component-586b7cd67f-gb8f7 Total loading time: 0 Render date: 2024-11-26T20:14:36.896Z Has data issue: false hasContentIssue false

Liquid Delivery CVD of Ferroelectric (Pb,La)(Zr,Ti)O3 Thin Films

Published online by Cambridge University Press:  15 February 2011

W. Tao
Affiliation:
Department of Materials Science and Engineering, Virginia Polytechnic Institute and State University, Blacksburg, VA 24061
S.B. Desu
Affiliation:
Department of Materials Science and Engineering, Virginia Polytechnic Institute and State University, Blacksburg, VA 24061
C.H. Peng
Affiliation:
CERAM-Virginia Inc., Blacksburg, VA 24060
B. Dickerson
Affiliation:
Department of Materials Science and Engineering, Virginia Polytechnic Institute and State University, Blacksburg, VA 24061
T.K. Li
Affiliation:
Department of Materials Science and Engineering, Virginia Polytechnic Institute and State University, Blacksburg, VA 24061
C.L. Thio
Affiliation:
Department of Materials Science and Engineering, Virginia Polytechnic Institute and State University, Blacksburg, VA 24061
J.J. Lee
Affiliation:
Department of Materials Science and Engineering, Virginia Polytechnic Institute and State University, Blacksburg, VA 24061
W. Hendricks
Affiliation:
Department of Materials Science and Engineering, Virginia Polytechnic Institute and State University, Blacksburg, VA 24061
Get access

Abstract

High quality lanthanum doped PZT films were deposited on platinum coated silicon wafers by direct liquid injection MOCVD using lead bis-tetramethylheptadione, lanthanum tri-tetramethylheptadione, zirconium tetramethylheptadione, and titanium ethoxide as precursors. The films were deposited at 650°C and a reduced pressure of 5 Torr. The deposition rates were higher than 10 nm/min. The liquid delivery system led to highly reproducible deposition rate, composition, and ferroelectric properties in the PLZT films. The remanent polarization of the films decreased from about 25 μC/cm2 for PLZT(0/55/45) to about 12 μC/cm2 for PLZT(8/55/45). The coercive field of the films seemed to be independent on the La doping concentration up to 8% La doping.

Type
Research Article
Copyright
Copyright © Materials Research Society 1995

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Xu, Yuhuan, Ferroelectric materials and their applications, Elsevier Science Publishers B.V., 1991.Google Scholar
2. Swartz, S.L., IEEE Transactions on Electrical Insulation 25, 935 (1990).Google Scholar
3. Krupanidhi, S.B., Hu, H., and Kumar, V., J. Appl. Phys. 71, 376 (1992).Google Scholar
4. Sreenivas, K. and Sayer, M., J. Appl. Phys. 64, 1484 (1988).Google Scholar
5. Oikawa, M. and Toda, K., Appl. Phys. Lett. 29, 491 (1976).Google Scholar
6. Mansingh, A. and Krupanidhi, S.B., J. Appl. Phys. 51, 5408 (1980).Google Scholar
7. Haertling, G.H., J. Vac. Sci. Technol. A9, 414 (1991).Google Scholar
8. Dey, S.K. and Zuleeg, R., Ferroelectrics 108, 37 (1991).Google Scholar
9. Okada, M., Takai, S., Amemiya, M., and Tominaga, K., Jpn. J. Appl. Phys. 28, 1030 (1989).Google Scholar
10. Zhang, J., Gardiner, R.A., Kirlin, P.S., Boerstler, R.W., and Steinbeck, J., Appl. Phys. Lett. 61, 2884 (1992).Google Scholar
11. Tao, W., Desu, S.B., and Li, T.K., under revising.Google Scholar