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Light-Excited Structural Instability of a-Si:H

Published online by Cambridge University Press:  10 February 2011

G.L. Kong ,
D.L. Zhang ,
G.Z. Yue ,
Y.Q. Wang  and
X.B. Liao
G.L. Kong
Affiliation:
State Laboratory for Surface Physics, Institute of Semiconductors & Center for Condensed Matter Physics, Chinese Academy of Sciences, P. O. Box 912, Beijing, 100083, China, [email protected]
D.L. Zhang
Affiliation:
Institute of Physics & Center for Condensed Matter Physics, Chinese Academy of Sciences, P. O. Box 603, Beijing, 100080, China, [email protected]
G.Z. Yue
Affiliation:
State Laboratory for Surface Physics, Institute of Semiconductors & Center for Condensed Matter Physics, Chinese Academy of Sciences, P. O. Box 912, Beijing, 100083, China, [email protected]
Y.Q. Wang
Affiliation:
State Laboratory for Surface Physics, Institute of Semiconductors & Center for Condensed Matter Physics, Chinese Academy of Sciences, P. O. Box 912, Beijing, 100083, China, [email protected]
X.B. Liao
Affiliation:
State Laboratory for Surface Physics, Institute of Semiconductors & Center for Condensed Matter Physics, Chinese Academy of Sciences, P. O. Box 912, Beijing, 100083, China, [email protected]
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Abstract

With the accumulation of experimental data, it has been recognized by many that the light-induced metastable change of a-Si:H, Staebler-Wronski effect (SWE), may be related to a structural instability of the whole a-Si:H network. However, direct evidence of such a structural change is still lacking. In the present paper, the efforts of our laboratory in this direction will be reviewed, including the light-induced changes of Si-H bond absorption, low frequency dielectric response, and an apparent photo-dilation effect.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 507: Symposium A – Amorphous & Microcrystalline Silicon Technology 1998 , 1998 , 697
Copyright
Copyright © Materials Research Society 1998

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References

REFERENCES

[1] Staebler, D. L. and Wronski, C. R., Appl. Phys. Lett. 31, p. 292 (1997)Google Scholar
[2] Carlson, D. E., Solar Energy Mater. 8, p.129 (1982); D. E. Carlson, A. M. More, D. J. Szostak, B. Goldstein, R- W. Smith, P. J. Eunzuchi, and W. R. Frenchu, Solar Cells 9, p. 19(1983)Google Scholar
[3] Fritzsche, H., Kakalios, J., and Bernstei, D., in Optical Effects in Amorphous Semiconductors 1984, edited by Taylor, P. C., and Bishop, S. G., AIP Conf. Proc. No. 120 (AIP. New York, 1984) p. 229 Google Scholar
[4] Jang, J., Lee, L. G., Park, S. C., and Lee, C. C., Appl. Phys. Lett. 51, p. 1,673 (1987)Google Scholar
[5] Kong, G. L., Zhang, D. L., Zhao, Y. P., Sun, G. S., Pan, G. Q., and Liao, X. B., J. Non-Crys. Solids 164–166, p. 211 (1993)Google Scholar
[6] Yiping, Zhao, Dianlin, Zhang, Guanglin, Kong, Guangqin, Pan, and Xianbo, Liao, Phys. Rev. Lett. 74, p. 558 (1995)Google Scholar
[7] Kong, G. L., Zhang, D. L., Zhao, Y. P., and Liao, X. B., Solid State Phenomena, Vols. 44–46, pp. 677–684 (1995)Google Scholar
[8] Deng, X. M., Phys. Rev. B 43, p. 4,820 (1991)Google Scholar
[9] Fritzsche, H., Solid State Commu. 94, p. 953 (1995)Google Scholar
[10] Han, Daxing, Qui, Changhua and Wu, Wenhao, Phil. Mag. B 54, L9 (1986)Google Scholar
[11] Guanglin, Kong, Zili, Mao, Chinese J. of Semiconductors 10, p. 479 (1989)Google Scholar
[12] Guozhen, Yue, Guanglin, Kong, Dianlin, Zhang, Zhixun, Ma, Shuran, Sheng, and Xianbo, Liao, Phys. Rev. B 57, p. 2,387 (1998)Google Scholar
[13] Gibb, I. G. and Long, A. R., Phil. Mag. B 49, 565 (1984)Google Scholar
[14] Guanglin, Kong, Dianlin, Zhang, Guozhen, Yue, and Xianbo, Liao, Phys. Rev. Lett. 79, p. 4,210 (1997)Google Scholar
[15] Hoffman, R. W., Physics of Nonmetallic Thin Films, edited by Dupuy, S. H. S. & Cachard, A. Google Scholar
[16] White, R. M., J. Appl. Phys. 34, p. 3,559 (1963)Google Scholar