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Light Induced Defect Creation Kinetics in Thin Film Protocrystalline Silicon Materials and Their Solar Cells

Published online by Cambridge University Press:  01 February 2011

C. R. Wronski ,
J. M. Pearce ,
R. J. Koval ,
X. Niu ,
A. S. Ferlauto ,
J. Koh  and
R. W. Collins
C. R. Wronski
Affiliation:
Center For Thin Film Devices, The Pennsylvania State University, University Park, PA
J. M. Pearce
Affiliation:
Center For Thin Film Devices, The Pennsylvania State University, University Park, PA
R. J. Koval
Affiliation:
Center For Thin Film Devices, The Pennsylvania State University, University Park, PA
X. Niu
Affiliation:
Center For Thin Film Devices, The Pennsylvania State University, University Park, PA
A. S. Ferlauto
Affiliation:
Center For Thin Film Devices, The Pennsylvania State University, University Park, PA
J. Koh
Affiliation:
Center For Thin Film Devices, The Pennsylvania State University, University Park, PA
R. W. Collins
Affiliation:
Center For Thin Film Devices, The Pennsylvania State University, University Park, PA
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Abstract

Using real time spectroscopic ellipsometry to characterize the microstructure and evolutionary growth of Si:H materials deposited with and without hydrogen dilution, phase diagrams were developed which clearly defined and established growth in the protocrystalline regime. Guided by these phase diagrams thin films and intrinsic layers in p-i-n cell structures were grown which consist solely of the protocrystalline phase so that the bulk uniform properties of the material could be characterized with confidence. Studies were carried out on the light induced changes in these films and cell structures that include the annealing out of defects as well as their creation under 1 sun illumination at temperatures from 25°C to 100°C that include the attainment of a degraded steady states (DSS). Defect states were characterized in films with electron mobility lifetimes (μτ), and subgap absorption at 1.2eV (α(1.2)); and in the i material of the p-i-n cells by the bulk limited fill factor (FF). The contributions of the different gap states to SWE are identified and characterized. The absence of direct correlations between α(1.2) with μτ and FF present in undiluted and diluted materials also found in protocrystalline Si:H. Similarities, on the other hand, are found between the μτ products and the FFs including the striking changes in the kinetics that occur at ∼40°C. Direct correlations between the changes in μτ and FF at different temperatures are presented. The reason for this correlation and lack of it for α(1.2) are briefly discussed with direct correlation of the α(1.2) to cell characteristics being presented, be it not with the FF.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 715: Symposium A – Amorphous and Heterogeneous Silicon-Based Films-2002 , 2002 , A13.4
Copyright
Copyright © Materials Research Society 2002

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