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Light Effective Mass in the Widely-Dispersed Valence Band of Single Crystalline Rubrene Observed by High-Resolution Angle-Resolved Ultraviolet Photoelectron Spectroscopy

Published online by Cambridge University Press:  31 January 2011

Yasuo Nakayama
Affiliation:
[email protected], Chiba University, Center for Frontier Science, Chiba, Japan
Shin-ichi Machida
Affiliation:
[email protected], Chiba University, Graduate School of Advanced Integration Science, Chiba, Japan
Steffen Duhm
Affiliation:
[email protected], Chiba University, Graduate School of Advanced Integration Science, Chiba, Japan
Qian Xin
Affiliation:
[email protected], Chiba University, Graduate School of Advanced Integration Science, Chiba, Japan
Akihiro Funakoshi
Affiliation:
[email protected], Chiba University, Graduate School of Advanced Integration Science, Chiba, Japan
Naoki Ogawa
Affiliation:
[email protected], Chiba University, Graduate School of Advanced Integration Science, Chiba, Japan
Satoshi Kera
Affiliation:
[email protected], Chiba University, Graduate School of Advanced Integration Science, Chiba, Japan
Nobuo Ueno
Affiliation:
[email protected], Chiba University, Graduate School of Advanced Integration Science, Chiba, Japan
Yutaka Noguchi
Affiliation:
[email protected], Chiba University, Center for Frontier Science, Chiba, Japan
Hisao Ishii
Affiliation:
[email protected], Chiba University, Center for Frontier Science, Chiba, Japan
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Abstract

High-resolution angle resolved ultraviolet photoelectron spectroscopy measurements were conducted on rubrene single crystals successfully through relief of the sample charging assisted by a laser illumination. Significant dispersion of the valence band was clearly resolved. The band width W and the hole effective mass mh* were estimated to be 0.4 eV and 0.7m0, respectively, along the most conductive direction. The present results strongly suggest that the transport nature in rubrene single crystals should be described in the band transport framework of a delocalized charge carrier.

Type
Research Article
Copyright
Copyright © Materials Research Society 2010

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