Published online by Cambridge University Press: 10 February 2011
Thin films of crystalline and amorphous V2O5 were deposited by pulsed laser deposition (PLD) and the chemical diffusion coefficients, , were measured by the potentiostatic intermittent titration technique (PITT). In crystalline V2O5 films, the maximum and minimum
were found to be 1.7 × 10−2 cm2/s and 5.8 × 10−15 cm2/s respectively, with a general trend for
to rise in single-phase regions. The changes in
correlated well to the known phases in LiV2O5. In amorphous V2O5 films,
exhibited a smooth, continuous decrease as the Li concentration increased.