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Lead Iodide X-Ray and Gamma-Ray Spectrometers for Room and High Temperature Operation

Published online by Cambridge University Press:  10 February 2011

H. Hermon ,
R. B. James ,
J. Lund ,
E. Cross ,
A. Antolak ,
D. H. Morse ,
D. L. Medlin ,
E. Soria ,
J. Van Scyoc  and
B. Brunett
...Show all authors
H. Hermon
Affiliation:
Sandia National Laboratories, Livermore, CA
R. B. James
Affiliation:
Sandia National Laboratories, Livermore, CA
J. Lund
Affiliation:
Sandia National Laboratories, Livermore, CA
E. Cross
Affiliation:
Sandia National Laboratories, Livermore, CA
A. Antolak
Affiliation:
Sandia National Laboratories, Livermore, CA
D. H. Morse
Affiliation:
Sandia National Laboratories, Livermore, CA
D. L. Medlin
Affiliation:
Sandia National Laboratories, Livermore, CA
E. Soria
Affiliation:
Sandia National Laboratories, Livermore, CA
J. Van Scyoc
Affiliation:
Sandia National Laboratories, Livermore, CA
B. Brunett
Affiliation:
Sandia National Laboratories, Livermore, CA
M. Schieber
Affiliation:
Also at the Hebrew university of Jerusalem, Jerusalem, Israel.
T. E. Schlesinger
Affiliation:
Carnegie Mellon University, Pittsburgh, PA
J. Toney
Affiliation:
Carnegie Mellon University, Pittsburgh, PA
M. Goorsky
Affiliation:
UCLA, Los Angeles, CA
Hojun Yoon
Affiliation:
UCLA, Los Angeles, CA
A. Burger
Affiliation:
Fisk University, Nashville, TN
L. Salary
Affiliation:
Fisk University, Nashville, TN
K.-T. Chen
Affiliation:
Fisk University, Nashville, TN
Y.-C. Chang
Affiliation:
University of Illinois, Urbana, IL
K. Shah
Affiliation:
RMD, Inc., Watertown, MA
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Abstract

In this study we report on the results of the investigation of lead iodide material properties. The effectiveness of a zone refining purification method on the material purity is determined by ICP-MS and ICP-OES and correlated to the electrical and physical material properties. We show that this zone refining method is very efficient in removing impurities from lead iodide, and we also determine the segregation coefficient for some of these impurities. Triple axis x-ray diffraction (TAD) analysis has been used to determine the crystalline perfection of the lead iodide after applying various cutting, etching and fabrication methods. The soft lead iodide crystal was found to be damaged when cleaved by a razor blade, but by using a diamond wheel saw, followed by etching, the crystallinity of the material was much improved, as observed by TAD. Low temperature photoluminescence also indicates an improvement in the material properties of the purified lead iodide. Electrical properties of lead iodide such as carrier mobility, were calculated based on carrier - phonon scattering. The results for the electrical properties were in good agreement with the experimental data.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 487: Symposium I – Semiconductors for Room-Temperature Radiation II , 1997 , 361
Copyright
Copyright © Materials Research Society 1998

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