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Layer Thickness Dependence of Transport Properties in Y1Ba2Cu3O7-y Superconducting Multilayer Films

Published online by Cambridge University Press:  28 February 2011

Sang Yeol Lee ,
Eiki Narumi  and
David T. Shaw
Sang Yeol Lee
Affiliation:
Department of Electrical and Computer Engineering, New York State Institute on Superconductivity, State University of New York at Buffalo, Buffalo, New York 14260
Eiki Narumi
Affiliation:
Department of Electrical and Computer Engineering, New York State Institute on Superconductivity, State University of New York at Buffalo, Buffalo, New York 14260
David T. Shaw
Affiliation:
Department of Electrical and Computer Engineering, New York State Institute on Superconductivity, State University of New York at Buffalo, Buffalo, New York 14260
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Abstract

Multilayers of Y1Ba2Cu3O7-y/Y1Ba2(Cu1−xNix)3O7-ysuperconducting thin films have been grown epitaxially on (100) ZrO2 substrates using a pulsed laser deposition technique. The thickness of the Y1Ba2Cu3O7-y layer was varied from 60 Å to 900 Å and the thickness of the Y1Ba2(Cu1−xNix3O7-y layer was varied from 60 A to 100 A to determine the effect of the Ni-doped layers on the superconducting properties. Variations of critical current density were investigated as a function of temperature in magnetic fields up to 5 T. Magnetic field dependence of normalized critical current density, Jc(H)/Jc(O), is improved by the growth of Ni-doped multilayer structures, possibly due to an increase in flux pinning force.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 235: Symposium A – Phase Formation and Modification by Beam-Solid Interactions , 1991 , 659
Copyright
Copyright © Materials Research Society 1992

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References

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