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Laser Processing in Silicon Molecular Beam Epitaxy

Published online by Cambridge University Press:  15 February 2011

T. De Jong
Affiliation:
FOM-Institute for Atomic and Molecular Physics, P.O. Box 41883, 1009 DB Amsterdam, The Netherlands
L. Smit
Affiliation:
FOM-Institute for Atomic and Molecular Physics, P.O. Box 41883, 1009 DB Amsterdam, The Netherlands
V.V. Korablev
Affiliation:
FOM-Institute for Atomic and Molecular Physics, P.O. Box 41883, 1009 DB Amsterdam, The Netherlands
F.W. Saris
Affiliation:
FOM-Institute for Atomic and Molecular Physics, P.O. Box 41883, 1009 DB Amsterdam, The Netherlands
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Abstract

We have grown epitaxial silicon films on silicon (100), (110) and (111) oriented substrates, using pulsed ruby laser irradiation as a means to obtain clean, ordered substrate surfaces. On these surfaces epitaxial layers were grown in two ways: I. Rȯom temperature deposition and pulsed laser induced epitaxy of 100–300 nm films was carried out repeatedly, yielding ∼1 μm thick epitaxial layers. II. Low temperature molecular beam epitaxy (M.B.E.), even at 250°C on Si(100),of layers up to 1 μm.

Applying the second technique to implanted substrates, we annealed and cleaned arsenic implanted silicon (100) samples in situ, and produced epitaxial overlayers of 100–1000 nm, thus creating a buried n-type channel in silicon.

Type
Research Article
Copyright
Copyright © Materials Research Society 1982

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References

REFERENCES

1. Zehner, D.M., White, C.W. and Ownby, G.W., Surface Science Letters 92, L67, 1980.Google Scholar
2. Hoonhout, D. and Saris, F.W. in: Laser and Electron-Beam Solid Interactions and Materials Processing, Gibbons, J.F., Hess, L.D., Sigmon, T.W. eds. (North Holland 1981) pp. 3137.Google Scholar