Hostname: page-component-cd9895bd7-hc48f Total loading time: 0 Render date: 2024-12-27T02:04:43.376Z Has data issue: false hasContentIssue false

Ion Implantation and Annealing of SrTiO3 and CaTiO3

Published online by Cambridge University Press:  25 February 2011

C. W. White
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, TN 37831
L. A. Boatner
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, TN 37831
J. Rankin
Affiliation:
Massachusetts Institute of Technology, Cambridge, MA 02139
M. J. Aziz
Affiliation:
Division of Applied Sciences, Harvard University, Cambridge, MA 02138
Get access

Abstract

Ion implantation damage and thermal annealing results are presented for single crystals of SrTiO3 and CaTiO3. The near-surface region of both of these materials can be made amorphous by low doses (∼1015/cm2 ) of heavy ions (Pb at 540 keV). During annealing, the amorphous implanted region crystallizes epitaxially on the underlying single-crystal substrate. The kinetics of this solid-phase epitaxial recrystallization process have been measured by employing ion channeling techniques.

Type
Research Article
Copyright
Copyright © Materials Research Society 1987

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

Footnotes

Research sponsored by the Division of Materials Sciences, U.S. Department of Energy under contract DE-ACO5-840R21400 with Martin Marietta Energy Systems, Inc.

References

REFERENCES

1. McHargue, C.J., Nucl. Instrum. Methods B 19/20, 797 (1987).Google Scholar
2. Ohkubo, M., Hioki, T., and Kawamoto, J., J. Appl. Phys. 60, 1325 (1986).Google Scholar
3. McHargue, C.J., White, C.W., Appleton, B.R., Farlow, C.G., and Williams, J.M., Mat. Res. Soc. Proc. 27, 385 (1984).Google Scholar
4. Burnett, P.J. and Page, T.F., J. Mater. Sci. 19, 845 (1984).Google Scholar
5. Naramoto, H., White, C.W., Williams, J.M., McHargue, C.J., Holland, O.W., Abraham, M.M., and Appleton, B.R., J. Appl. Phys. 54, 683 (1983).Google Scholar
6. Poker, D., these proceedings.Google Scholar
7. White, C.W., Farlow, G.C., McHargue, C.J., Sklad, P.S., Angelini, M.P., and Appleton, B.R., Nucl. Instrum. Methods B 7/8, 473 (1985).Google Scholar
8. White, C.W., Sklad, P.S., Boatner, L.A., Farlow, G.C., McHargue, C.J., Sales, B.C., and Aziz, M.J., Mat. Res. Soc. Proc. 60, 337 (1986).Google Scholar
9. White, C.W., Boatner, L.A., Sklad, P.S., McHargue, C.J., Pennycook, S.J., Aziz, M.J., Farlow, G.C., and Rankin, J., Mat. Res. Soc. Proc. 74 (in press).Google Scholar
10. See for example: Narayan, J., Holland, O.W., and Appleton, B.R., J. Vac. Sci. Technol. B 1, 871 (1983), and references contained therein.Google Scholar